Nanotomography of Inverse Photonic Crystals Using Zernike Phase Contrast

X-ray full field microscopy usingsynchrotron radiation is afrequently used tool inmaterial science. In particular for low absorbing samples,however,the contrast is often not sufficient for tomography. To enhance the contrast of this type of materialsthe established technique of Zernike Phase Contrast(ZPC) [1,2,3]has been implementedat the Nanotomography endstationof the Imaging Beamline P05 at PETRA III storage ring, located at DESY (Hamburg, Germany).Using an energy of 11 keV, a spatial resolution of 100nm wasachieved and the obtainedhigh contrast made 3D investigation of low absorbing materials possible. Inverse photonic crystals consisting of hollow spheres absorbvery littledue to their high air content and are therefore an ideal test system for the ZPC tomography setup