Radiation Hardening of Digital Color CMOS Camera-on-a-Chip Building Blocks for Grad Total Ionizing Dose Environments

Radiation Hardness Comparison of CMOS Image Sensor Technologies at High Total Ionizing Dose Levels

Rizzolo, Serena
Goiffon, Vincent
Corbière, Franck
Molina, Romain
Chabane, Aziouz
Girard, Sylvain
Paillet, Philippe
Magnan, Pierre
Boukenter, Aziz
Allanche, Timothé
Muller, Cyprien
Monsanglant-Louvet, Celine
Osmond, Melanie
Desjonquères, Hortense
Macé, Jean Reynald
Burnichon, Pierre
Baudu, Jean-Pierre
Plumeri, Stéphane

January 2019

The impact of the manufacturing process on the radiation-induced degradation effects observed in CMO...

Radiation Hardness Comparison of CMOS Image Sensor Technologies at High Total Ionizing Dose Levels

Rizzolo, Serena
Goiffon, Vincent
Corbière, Franck
Molina, Romain
Chabane, Aziouz
Girard, Sylvain
Paillet, Philippe
Magnan, Pierre
Boukenter, Aziz
Allanche, Timothé
Muller, Cyprien
Monsanglant-Louvet, Celine
Osmond, Melanie
Desjonquères, Hortense
Macé, Jean Reynald
Burnichon, Pierre
Baudu, Jean-Pierre
Plumeri, Stéphane

January 2019

The impact of the manufacturing process on the radiation-induced degradation effects observed in CMO...

Radiation Hardness Comparison of CMOS Image Sensor Technologies at High Total Ionizing Dose Levels

Rizzolo, Serena
Goiffon, Vincent
Corbière, Franck
Molina, Romain
Chabane, Aziouz
Girard, Sylvain
Paillet, Philippe
Magnan, Pierre
Boukenter, Aziz
Allanche, Timothé
Muller, Cyprien
Monsanglant-Louvet, Celine
Osmond, Melanie
Desjonquères, Hortense
Macé, Jean Reynald
Burnichon, Pierre
Baudu, Jean-Pierre
Plumeri, Stéphane

January 2019

The impact of the manufacturing process on the radiation-induced degradation effects observed in CMO...

Radiation Hardness Comparison of CMOS Image Sensor Technologies at High Total Ionizing Dose Levels

Rizzolo, Serena
Goiffon, Vincent
Corbière, Franck
Molina, Romain
Chabane, Aziouz
Girard, Sylvain
Paillet, Philippe
Magnan, Pierre
Boukenter, Aziz
Allanche, Timothé
Muller, Cyprien
Monsanglant-Louvet, Celine
Osmond, Melanie
Desjonquères, Hortense
Macé, Jean Reynald
Burnichon, Pierre
Baudu, Jean-Pierre
Plumeri, Stéphane

January 2018

The impact of the manufacturing process on the radiation-induced degradation effects observed in CMO...

Radiation Hardness Comparison of CMOS Image Sensor Technologies at High Total Ionizing Dose Levels

Rizzolo, Serena
Goiffon, Vincent
Corbière, Franck
Molina, Romain
Chabane, Aziouz
Girard, Sylvain
Paillet, Philippe
Magnan, Pierre
Boukenter, Aziz
Allanche, Timothé
Muller, Cyprien
Monsanglant-Louvet, Celine
Osmond, Melanie
Desjonquères, Hortense
Macé, Jean Reynald
Burnichon, Pierre
Baudu, Jean-Pierre
Plumeri, Stéphane

January 2018

The impact of the manufacturing process on the radiation-induced degradation effects observed in CMO...

Radiation Hardness Comparison of CMOS Image Sensor Technologies at High Total Ionizing Dose Levels

Rizzolo, Serena
Goiffon, Vincent
Corbière, Franck
Molina, Romain
Chabane, Aziouz
Girard, Sylvain
Paillet, Philippe
Magnan, Pierre
Boukenter, Aziz
Allanche, Timothé
Muller, Cyprien
Monsanglant-Louvet, Celine
Osmond, Melanie
Desjonquères, Hortense
Macé, Jean Reynald
Burnichon, Pierre
Baudu, Jean-Pierre
Plumeri, Stéphane

January 2018

The impact of the manufacturing process on the radiation-induced degradation effects observed in CMO...

Radiation Hardness Comparison of CMOS Image Sensor Technologies at High Total Ionizing Dose Levels

Rizzolo, Serena
Goiffon, Vincent
Corbière, Franck
Molina, Romain
Chabane, Aziouz
Girard, Sylvain
Paillet, Philippe
Magnan, Pierre
Boukenter, Aziz
Allanche, Timothé
Muller, Cyprien
Monsanglant-Louvet, Celine
Osmond, Melanie
Desjonquères, Hortense
Macé, Jean Reynald
Burnichon, Pierre
Baudu, Jean-Pierre
Plumeri, Stéphane

January 2018

The impact of the manufacturing process on the radiation-induced degradation effects observed in CMO...

Radiation Hardness Comparison of CMOS Image Sensor Technologies at High Total Ionizing Dose Levels

Rizzolo, Serena
Goiffon, Vincent
Corbière, Franck
Molina, Romain
Chabane, Aziouz
Girard, Sylvain
Paillet, Philippe
Magnan, Pierre
Boukenter, Aziz
Allanche, Timothé
Muller, Cyprien
Monsanglant-Louvet, Celine
Osmond, Melanie
Desjonquères, Hortense
Macé, Jean Reynald
Burnichon, Pierre
Baudu, Jean-Pierre
Plumeri, Stéphane

January 2018

The impact of the manufacturing process on the radiation-induced degradation effects observed in CMO...

Radiation Hardness Comparison of CMOS Image Sensor Technologies at High Total Ionizing Dose Levels

Rizzolo, Serena
Goiffon, Vincent
Corbière, Franck
Molina, Romain
Chabane, Aziouz
Girard, Sylvain
Paillet, Philippe
Magnan, Pierre
Boukenter, Aziz
Allanche, Timothé
Muller, Cyprien
Monsanglant-Louvet, Celine
Osmond, Melanie
Desjonquères, Hortense
Macé, Jean Reynald
Burnichon, Pierre
Baudu, Jean-Pierre
Plumeri, Stéphane

January 2018

The impact of the manufacturing process on the radiation-induced degradation effects observed in CMO...

Total Ionizing Dose Effects on a Radiation-Hardened CMOS Image Sensor Demonstrator for ITER Remote Handling

Goiffon, Vincent
Rizzolo, Serena
Corbière, Franck
Rolando, Sébastien
Bounasser, Said
Sergent, Marius
Chabane, Aziouz
Marcelot, Olivier
Estribeau, Magali
Magnan, Pierre
Paillet, Philippe
Girard, Sylvain
Gaillardin, Marc
Marcandella, Claude
Allanche, Timothé
Van Uffelen, Marco
Casellas, Laura Mont
Scott, Robin
De Cock, Wouter

January 2018

Total ionizing dose effects are studied on a radiation hardened by design (RHBD) 256×256 -pixel CMOS...

Exploration of Pinned Photodiode Radiation Hardening Solutions Through TCAD Simulations

Marcelot, Olivier
Goiffon, Vincent
Magnan, Pierre

August 2019

The use of pinned photodiode (PPD) based CMOS image sensors in harsh radiation environment (such as ...

Radiation Hardness Comparison of CMOS Image Sensor Technologies at High Total Ionizing Dose Levels

Rizzolo, Serena
Goiffon, Vincent
Corbière, Franck
Molina, Romain
chabane, aziouz
Girard, Sylvain
Paillet, Philippe
Magnan, Pierre
Boukenter, Aziz
Allanche, Timothé
Muller, Cyprien
Monsanglant-Louvet, Celine
Osmond, Melanie
Desjonquères, Hortense
Macé, Jean Reynald
Burnichon, Pierre
Baudu, Jean-Pierre
Plumeri, Stéphane

November 2018

International audienceThe impact of the manufacturing process on the radiation-induced degradation e...

Annealing Effects on Radiation-Hardened CMOS Image Sensors Exposed to Ultrahigh Total Ionizing Doses

Dewitte, Hugo
Rizzolo, Serena
Paillet, Philippe
Magnan, Pierre
Le Roch, Alexandre
Corbière, Franck
Molina, Romain
Girard, Sylvain
Allanche, Timothé
Muller, Cyprien
Desjonquères, Hortense
Macé, Jean Reynald
Baudu, Jean-Pierre
Flores, A. Saravia
Goiffon, Vincent

July 2020

Capabilities of rad-hard electronics are often degraded by post-irradiation annealing, whose effects...

CAMRAD: Development of a Multi-Megagray Radiation Hard CMOS Camera for Dismantling Operations

Goiffon, Vincent
Allanche, Timothé
Muller, Cyprien
Girard, Sylvain
Paillet, Philippe
Macé, Jean Reynald
Osmond, Melanie
Burnichon, Pierre
Plumeri, Stéphane
Baudu, Jean-Pierre
Boukenter, Aziz
Magnan, Pierre
Rizzolo, Serena
Corbière, Franck
Duhamel, Olivier
Rousson, johanna
Desjonquères, Hortense
Molina, Romain
Ouerdane, Youcef
Lépine, Thierry

January 2018

The CAMRAD research and development project aims at developing a new high performance CMOS radiatio...

Radiation Hardness Comparison of CMOS Image Sensor Technologies at High Total Ionizing Dose Levels

Rizzolo, Serena
Goiffon, Vincent
Corbière, Franck
Molina, Romain
Chabane, Aziouz
Girard, Sylvain
Paillet, Philippe
Magnan, Pierre
Boukenter, Aziz
Allanche, Timothé
Muller, Cyprien
Monsanglant-Louvet, Celine
Osmond, Melanie
Desjonquères, Hortense
Macé, Jean Reynald
Burnichon, Pierre
Baudu, Jean-Pierre
Plumeri, Stéphane

January 2019

The impact of the manufacturing process on the radiation-induced degradation effects observed in CMO...

Radiation Hardness Comparison of CMOS Image Sensor Technologies at High Total Ionizing Dose Levels

Rizzolo, Serena
Goiffon, Vincent
Corbière, Franck
Molina, Romain
Chabane, Aziouz
Girard, Sylvain
Paillet, Philippe
Magnan, Pierre
Boukenter, Aziz
Allanche, Timothé
Muller, Cyprien
Monsanglant-Louvet, Celine
Osmond, Melanie
Desjonquères, Hortense
Macé, Jean Reynald
Burnichon, Pierre
Baudu, Jean-Pierre
Plumeri, Stéphane

January 2019

The impact of the manufacturing process on the radiation-induced degradation effects observed in CMO...

Radiation Hardness Comparison of CMOS Image Sensor Technologies at High Total Ionizing Dose Levels

Rizzolo, Serena
Goiffon, Vincent
Corbière, Franck
Molina, Romain
Chabane, Aziouz
Girard, Sylvain
Paillet, Philippe
Magnan, Pierre
Boukenter, Aziz
Allanche, Timothé
Muller, Cyprien
Monsanglant-Louvet, Celine
Osmond, Melanie
Desjonquères, Hortense
Macé, Jean Reynald
Burnichon, Pierre
Baudu, Jean-Pierre
Plumeri, Stéphane

January 2019

The impact of the manufacturing process on the radiation-induced degradation effects observed in CMO...

Radiation Hardness Comparison of CMOS Image Sensor Technologies at High Total Ionizing Dose Levels

Rizzolo, Serena
Goiffon, Vincent
Corbière, Franck
Molina, Romain
Chabane, Aziouz
Girard, Sylvain
Paillet, Philippe
Magnan, Pierre
Boukenter, Aziz
Allanche, Timothé
Muller, Cyprien
Monsanglant-Louvet, Celine
Osmond, Melanie
Desjonquères, Hortense
Macé, Jean Reynald
Burnichon, Pierre
Baudu, Jean-Pierre
Plumeri, Stéphane

January 2019

The impact of the manufacturing process on the radiation-induced degradation effects observed in CMO...

Radiation Hardness Comparison of CMOS Image Sensor Technologies at High Total Ionizing Dose Levels

Rizzolo, Serena
Goiffon, Vincent
Corbière, Franck
Molina, Romain
Chabane, Aziouz
Girard, Sylvain
Paillet, Philippe
Magnan, Pierre
Boukenter, Aziz
Allanche, Timothé
Muller, Cyprien
Monsanglant-Louvet, Celine
Osmond, Melanie
Desjonquères, Hortense
Macé, Jean Reynald
Burnichon, Pierre
Baudu, Jean-Pierre
Plumeri, Stéphane

January 2018

The impact of the manufacturing process on the radiation-induced degradation effects observed in CMO...

Radiation Hardness Comparison of CMOS Image Sensor Technologies at High Total Ionizing Dose Levels

Rizzolo, Serena
Goiffon, Vincent
Corbière, Franck
Molina, Romain
Chabane, Aziouz
Girard, Sylvain
Paillet, Philippe
Magnan, Pierre
Boukenter, Aziz
Allanche, Timothé
Muller, Cyprien
Monsanglant-Louvet, Celine
Osmond, Melanie
Desjonquères, Hortense
Macé, Jean Reynald
Burnichon, Pierre
Baudu, Jean-Pierre
Plumeri, Stéphane

January 2018

The impact of the manufacturing process on the radiation-induced degradation effects observed in CMO...

Radiation Hardness Comparison of CMOS Image Sensor Technologies at High Total Ionizing Dose Levels

Rizzolo, Serena
Goiffon, Vincent
Corbière, Franck
Molina, Romain
Chabane, Aziouz
Girard, Sylvain
Paillet, Philippe
Magnan, Pierre
Boukenter, Aziz
Allanche, Timothé
Muller, Cyprien
Monsanglant-Louvet, Celine
Osmond, Melanie
Desjonquères, Hortense
Macé, Jean Reynald
Burnichon, Pierre
Baudu, Jean-Pierre
Plumeri, Stéphane

January 2018

The impact of the manufacturing process on the radiation-induced degradation effects observed in CMO...

Radiation Hardness Comparison of CMOS Image Sensor Technologies at High Total Ionizing Dose Levels

Rizzolo, Serena
Goiffon, Vincent
Corbière, Franck
Molina, Romain
Chabane, Aziouz
Girard, Sylvain
Paillet, Philippe
Magnan, Pierre
Boukenter, Aziz
Allanche, Timothé
Muller, Cyprien
Monsanglant-Louvet, Celine
Osmond, Melanie
Desjonquères, Hortense
Macé, Jean Reynald
Burnichon, Pierre
Baudu, Jean-Pierre
Plumeri, Stéphane

January 2018

The impact of the manufacturing process on the radiation-induced degradation effects observed in CMO...

Radiation Hardness Comparison of CMOS Image Sensor Technologies at High Total Ionizing Dose Levels

Rizzolo, Serena
Goiffon, Vincent
Corbière, Franck
Molina, Romain
Chabane, Aziouz
Girard, Sylvain
Paillet, Philippe
Magnan, Pierre
Boukenter, Aziz
Allanche, Timothé
Muller, Cyprien
Monsanglant-Louvet, Celine
Osmond, Melanie
Desjonquères, Hortense
Macé, Jean Reynald
Burnichon, Pierre
Baudu, Jean-Pierre
Plumeri, Stéphane

January 2018

The impact of the manufacturing process on the radiation-induced degradation effects observed in CMO...

Radiation Hardness Comparison of CMOS Image Sensor Technologies at High Total Ionizing Dose Levels

Rizzolo, Serena
Goiffon, Vincent
Corbière, Franck
Molina, Romain
Chabane, Aziouz
Girard, Sylvain
Paillet, Philippe
Magnan, Pierre
Boukenter, Aziz
Allanche, Timothé
Muller, Cyprien
Monsanglant-Louvet, Celine
Osmond, Melanie
Desjonquères, Hortense
Macé, Jean Reynald
Burnichon, Pierre
Baudu, Jean-Pierre
Plumeri, Stéphane

January 2018

The impact of the manufacturing process on the radiation-induced degradation effects observed in CMO...

Total Ionizing Dose Effects on a Radiation-Hardened CMOS Image Sensor Demonstrator for ITER Remote Handling

Goiffon, Vincent
Rizzolo, Serena
Corbière, Franck
Rolando, Sébastien
Bounasser, Said
Sergent, Marius
Chabane, Aziouz
Marcelot, Olivier
Estribeau, Magali
Magnan, Pierre
Paillet, Philippe
Girard, Sylvain
Gaillardin, Marc
Marcandella, Claude
Allanche, Timothé
Van Uffelen, Marco
Casellas, Laura Mont
Scott, Robin
De Cock, Wouter

January 2018

Total ionizing dose effects are studied on a radiation hardened by design (RHBD) 256×256 -pixel CMOS...

Exploration of Pinned Photodiode Radiation Hardening Solutions Through TCAD Simulations

Marcelot, Olivier
Goiffon, Vincent
Magnan, Pierre

August 2019

The use of pinned photodiode (PPD) based CMOS image sensors in harsh radiation environment (such as ...

Radiation Hardness Comparison of CMOS Image Sensor Technologies at High Total Ionizing Dose Levels

Rizzolo, Serena
Goiffon, Vincent
Corbière, Franck
Molina, Romain
chabane, aziouz
Girard, Sylvain
Paillet, Philippe
Magnan, Pierre
Boukenter, Aziz
Allanche, Timothé
Muller, Cyprien
Monsanglant-Louvet, Celine
Osmond, Melanie
Desjonquères, Hortense
Macé, Jean Reynald
Burnichon, Pierre
Baudu, Jean-Pierre
Plumeri, Stéphane

November 2018

International audienceThe impact of the manufacturing process on the radiation-induced degradation e...

Annealing Effects on Radiation-Hardened CMOS Image Sensors Exposed to Ultrahigh Total Ionizing Doses

Dewitte, Hugo
Rizzolo, Serena
Paillet, Philippe
Magnan, Pierre
Le Roch, Alexandre
Corbière, Franck
Molina, Romain
Girard, Sylvain
Allanche, Timothé
Muller, Cyprien
Desjonquères, Hortense
Macé, Jean Reynald
Baudu, Jean-Pierre
Flores, A. Saravia
Goiffon, Vincent

July 2020

Capabilities of rad-hard electronics are often degraded by post-irradiation annealing, whose effects...

CAMRAD: Development of a Multi-Megagray Radiation Hard CMOS Camera for Dismantling Operations

Goiffon, Vincent
Allanche, Timothé
Muller, Cyprien
Girard, Sylvain
Paillet, Philippe
Macé, Jean Reynald
Osmond, Melanie
Burnichon, Pierre
Plumeri, Stéphane
Baudu, Jean-Pierre
Boukenter, Aziz
Magnan, Pierre
Rizzolo, Serena
Corbière, Franck
Duhamel, Olivier
Rousson, johanna
Desjonquères, Hortense
Molina, Romain
Ouerdane, Youcef
Lépine, Thierry

January 2018

The CAMRAD research and development project aims at developing a new high performance CMOS radiatio...

Radiation Hardness Comparison of CMOS Image Sensor Technologies at High Total Ionizing Dose Levels

Rizzolo, Serena
Goiffon, Vincent
Corbière, Franck
Molina, Romain
Chabane, Aziouz
Girard, Sylvain
Paillet, Philippe
Magnan, Pierre
Boukenter, Aziz
Allanche, Timothé
Muller, Cyprien
Monsanglant-Louvet, Celine
Osmond, Melanie
Desjonquères, Hortense
Macé, Jean Reynald
Burnichon, Pierre
Baudu, Jean-Pierre
Plumeri, Stéphane

January 2019

The impact of the manufacturing process on the radiation-induced degradation effects observed in CMO...

Radiation Hardness Comparison of CMOS Image Sensor Technologies at High Total Ionizing Dose Levels

Rizzolo, Serena
Goiffon, Vincent
Corbière, Franck
Molina, Romain
Chabane, Aziouz
Girard, Sylvain
Paillet, Philippe
Magnan, Pierre
Boukenter, Aziz
Allanche, Timothé
Muller, Cyprien
Monsanglant-Louvet, Celine
Osmond, Melanie
Desjonquères, Hortense
Macé, Jean Reynald
Burnichon, Pierre
Baudu, Jean-Pierre
Plumeri, Stéphane

January 2019

The impact of the manufacturing process on the radiation-induced degradation effects observed in CMO...

Radiation Hardness Comparison of CMOS Image Sensor Technologies at High Total Ionizing Dose Levels

Rizzolo, Serena
Goiffon, Vincent
Corbière, Franck
Molina, Romain
Chabane, Aziouz
Girard, Sylvain
Paillet, Philippe
Magnan, Pierre
Boukenter, Aziz
Allanche, Timothé
Muller, Cyprien
Monsanglant-Louvet, Celine
Osmond, Melanie
Desjonquères, Hortense
Macé, Jean Reynald
Burnichon, Pierre
Baudu, Jean-Pierre
Plumeri, Stéphane

January 2019

The impact of the manufacturing process on the radiation-induced degradation effects observed in CMO...

Radiation Hardness Comparison of CMOS Image Sensor Technologies at High Total Ionizing Dose Levels

Rizzolo, Serena
Goiffon, Vincent
Corbière, Franck
Molina, Romain
Chabane, Aziouz
Girard, Sylvain
Paillet, Philippe
Magnan, Pierre
Boukenter, Aziz
Allanche, Timothé
Muller, Cyprien
Monsanglant-Louvet, Celine
Osmond, Melanie
Desjonquères, Hortense
Macé, Jean Reynald
Burnichon, Pierre
Baudu, Jean-Pierre
Plumeri, Stéphane

January 2019

The impact of the manufacturing process on the radiation-induced degradation effects observed in CMO...

Radiation Hardening of Digital Color CMOS Camera-on-a-Chip Building Blocks for Grad Total Ionizing Dose Environments

Abstract

Extracted data

Radiation Hardening of Digital Color CMOS Camera-on-a-Chip Building Blocks for Grad Total Ionizing Dose Environments

Abstract

Extracted data

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