A method for storage status assessment of electronic devices by model-based prognostics

The assessment of storage status of electronic devices is a recently emerging issue, in both the military and commercial fields of China. It is extremely important for some weapons systems, which are required to operate for a very short time after being stored for a very long time. Accurate reliability evaluation of stored components is essential for these systems. The framework of the storage status assessment method is proposed, as sketched in Fig 1, including four key parts: failure mode, mechanism and effect analysis (FMMEA), accelerated test, physical model building, and model-based prognostics