In this chapter we present basic concepts which are relevant to link the results obtained from ellipsometry data analysis with fundamental properties of semiconductors for photovoltaic applications. The linear optical properties of semiconductors are best discussed in terms of the relationship between the dielectric function ε and the band structure.The authors thank the Spanish Ministry of Economy and Competitiveness (MINECO) for funding through grants CSD2010-00044, MAT2015-70850-P, and the “Severo Ochoa” Programme for Centres of Excellence in R&D (SEV- 2015-0496).Peer reviewe
grantor: University of TorontoWe present calculations of the linear dielectric function, t...
SIGLEAvailable from British Library Document Supply Centre- DSC:D40670/82 / BLDSC - British Library ...
Optical methods like spectroscopic ellipsometry are sensitive to structural properties of semicondu...
Ellipsometry is an optical method based on the study of the behavior of polarized light. The light r...
Spectroscopic ellipsometry (SE) is a non-contact, non-destructive characterization technique for pro...
This revised and updated edition of the well-received book by C. Klingshirn provides an introduction...
Spectroscopic ellipsometry has been applied to a wide variety of material and device characterizatio...
Organic solar cells attract both scientific and economic interest due to their potential for clean a...
Spectroscopic ellipsometry (SE) is a non-contact, non-destructive characterization technique for pro...
Author Institution: Crystal Branch, Metallurgy Division, Naval Research LaboratoryThe optical proper...
Author Institution: Crystal Branch, Metallurgy Division, Naval Research LaboratoryThe optical proper...
In the Electro-Optical Characterization group, within the National Center for Photovoltaic's Measure...
Typescript (photocopy)122 leaves, [7] leaves of plates : ill. ; 27 cm.Title page, contents and abstr...
grantor: University of TorontoWe present calculations of the linear dielectric function, t...
Optical reflection measurement techniques such as ellipsometry and reflectometry are commonly used t...
grantor: University of TorontoWe present calculations of the linear dielectric function, t...
SIGLEAvailable from British Library Document Supply Centre- DSC:D40670/82 / BLDSC - British Library ...
Optical methods like spectroscopic ellipsometry are sensitive to structural properties of semicondu...
Ellipsometry is an optical method based on the study of the behavior of polarized light. The light r...
Spectroscopic ellipsometry (SE) is a non-contact, non-destructive characterization technique for pro...
This revised and updated edition of the well-received book by C. Klingshirn provides an introduction...
Spectroscopic ellipsometry has been applied to a wide variety of material and device characterizatio...
Organic solar cells attract both scientific and economic interest due to their potential for clean a...
Spectroscopic ellipsometry (SE) is a non-contact, non-destructive characterization technique for pro...
Author Institution: Crystal Branch, Metallurgy Division, Naval Research LaboratoryThe optical proper...
Author Institution: Crystal Branch, Metallurgy Division, Naval Research LaboratoryThe optical proper...
In the Electro-Optical Characterization group, within the National Center for Photovoltaic's Measure...
Typescript (photocopy)122 leaves, [7] leaves of plates : ill. ; 27 cm.Title page, contents and abstr...
grantor: University of TorontoWe present calculations of the linear dielectric function, t...
Optical reflection measurement techniques such as ellipsometry and reflectometry are commonly used t...
grantor: University of TorontoWe present calculations of the linear dielectric function, t...
SIGLEAvailable from British Library Document Supply Centre- DSC:D40670/82 / BLDSC - British Library ...
Optical methods like spectroscopic ellipsometry are sensitive to structural properties of semicondu...