International audienceA methodology for building a transient model of an analog system is detailed. It does not require proprietary knowledge for integrated circuits (IC). At IC level, it combines a protection structure characterization and behavioral modeling with a core description. A specific test board is developed with a smart voltage regulator to validate the methodology. A system model is assembled to perform powered-on transient ESD simulations. A soft-failure criterion is chosen and the prediction of trends in soft-failure generation is carried out. The strong influence of the electrical environment is demonstrated through this case study
International audienceIn this paper, a behavioral modeling methodology to predict ElectroStatic-Disc...
With the steady increase of semi-conductor technologies and the explosion of embedded systems into s...
International audienceA system level modeling methodology is presented and validated on a simple cas...
International audienceA methodology for building a transient model of an analog system is detailed. ...
International audienceWith the increased number of embedded systems into our surrounding area, the e...
Les événements transitoires de forte puissance (EFT - Electrical Fast Transient) sont l'une des préo...
This dissertation describes several studies regarding the effects of system-level electrostatic disc...
International audienceDue to growing number of embedded electronics, estimating failure related to s...
Electrical Fast Transient (EFT) are one of the concerns of embedded system engineers. They can lead ...
To enable accurate system-level electrostatic discharge (ESD) simulation, models for the equipment u...
System level electrostatic discharge (ESD) testing of electronic products is a critical part of prod...
This thesis focuses on obtaining circuit models to simulate the voltage stress experienced by the de...
This thesis presents a methodology to model and simulate transient electrostatic discharge (ESD) res...
International audienceFor both Equipment Manufacturers (EM) and semiconductor suppliers, the predict...
Electro-static discharge (ESD) event can cause upset or permanent damage of integrated circuits (IC)...
International audienceIn this paper, a behavioral modeling methodology to predict ElectroStatic-Disc...
With the steady increase of semi-conductor technologies and the explosion of embedded systems into s...
International audienceA system level modeling methodology is presented and validated on a simple cas...
International audienceA methodology for building a transient model of an analog system is detailed. ...
International audienceWith the increased number of embedded systems into our surrounding area, the e...
Les événements transitoires de forte puissance (EFT - Electrical Fast Transient) sont l'une des préo...
This dissertation describes several studies regarding the effects of system-level electrostatic disc...
International audienceDue to growing number of embedded electronics, estimating failure related to s...
Electrical Fast Transient (EFT) are one of the concerns of embedded system engineers. They can lead ...
To enable accurate system-level electrostatic discharge (ESD) simulation, models for the equipment u...
System level electrostatic discharge (ESD) testing of electronic products is a critical part of prod...
This thesis focuses on obtaining circuit models to simulate the voltage stress experienced by the de...
This thesis presents a methodology to model and simulate transient electrostatic discharge (ESD) res...
International audienceFor both Equipment Manufacturers (EM) and semiconductor suppliers, the predict...
Electro-static discharge (ESD) event can cause upset or permanent damage of integrated circuits (IC)...
International audienceIn this paper, a behavioral modeling methodology to predict ElectroStatic-Disc...
With the steady increase of semi-conductor technologies and the explosion of embedded systems into s...
International audienceA system level modeling methodology is presented and validated on a simple cas...