A dual-polarised probe for near-field antenna measurements

A dual-polarised probe is discussed for planar nearfield (NF) antenna measurements with a background. The probe has a low cross-polarisation. Analysis has been revisited recently, results of which are presented. Computational power allows to use Method of Moments (MoM) tools. Bodies of revolution can be handled by a tool like CHAMP. A 3-dimensional MoM analysis has been carried out with the tool CST. Both CHAMP and CST are available at Wroclaw Technical University. Comparisons with old experimental results is shown. The analysis permits to realise an accurate probe model for efficient use in planar NF measurement schemes, including rectangular, polar or bipolar. Modelling shows that a fine meshing is needed in terms of wavelength to represent accurately low cross-polarisation levels