Three electro-optical bunch length detection systems based on spectral decoding have been installed and are being commissioned at the European XFEL. The systems are capable of recording individual longitudinal bunch profiles with sub-picosecond resolution at a bunch repetition rate 1.13 MHz. Bunch lengths and arrival times of entire bunch trains with single-bunch resolution have been measured as well as jitter and drifts for consecutive bunch trains. In this paper, we present first measurement results for the electro-optical detection system located after the second bunch compressor. A preliminary comparison with data from the bunch arrival-time monitor shows good agreement
The upcoming generation of hard X-ray free-electron lasers (XFEL) delivers X-raypulses with unmatche...
Abstract A combination of electro-optic detection of the Coulomb field of an electron bunch and sing...
In recent years, there has been increasing interest in short electron bunches for different applicat...
Three electro-optical bunch length detection systems based on spectral decoding have been installed ...
The electro-optical bunch length detection system based on electro-optic spectral decoding has been ...
At today's free-electron lasers, high-resolution electron bunch arrival time measurements have becom...
In modern free electron laser facilities like FLASH and European XFEL a high resolution intra train ...
Electro-optical detection has proven to be a valuable technique to study temporal profiles of THz pu...
The measurement of electron bunch-length with sub-ps time resolution is mandatory for future X-ray f...
AbstractLongitudinal diagnostics of the electron bunch shapes play a crucial role in the operation o...
The knowledge and control of electron bunch lengths is one of the key diagnostics in XFEL accelerato...
Recording electron bunch longitudinal profiles in single-shot, and non-destructively is largely need...
The continuous wave electron accelerator ELBE is upgraded to generate short and highly charged elect...
For the operation of a SASE FEL, the longitudinal bunch profile is one of the most critical paramete...
European XFEL comprises a 17.5 GeV linear accelerator for the generation of hard X-rays. Electron bu...
The upcoming generation of hard X-ray free-electron lasers (XFEL) delivers X-raypulses with unmatche...
Abstract A combination of electro-optic detection of the Coulomb field of an electron bunch and sing...
In recent years, there has been increasing interest in short electron bunches for different applicat...
Three electro-optical bunch length detection systems based on spectral decoding have been installed ...
The electro-optical bunch length detection system based on electro-optic spectral decoding has been ...
At today's free-electron lasers, high-resolution electron bunch arrival time measurements have becom...
In modern free electron laser facilities like FLASH and European XFEL a high resolution intra train ...
Electro-optical detection has proven to be a valuable technique to study temporal profiles of THz pu...
The measurement of electron bunch-length with sub-ps time resolution is mandatory for future X-ray f...
AbstractLongitudinal diagnostics of the electron bunch shapes play a crucial role in the operation o...
The knowledge and control of electron bunch lengths is one of the key diagnostics in XFEL accelerato...
Recording electron bunch longitudinal profiles in single-shot, and non-destructively is largely need...
The continuous wave electron accelerator ELBE is upgraded to generate short and highly charged elect...
For the operation of a SASE FEL, the longitudinal bunch profile is one of the most critical paramete...
European XFEL comprises a 17.5 GeV linear accelerator for the generation of hard X-rays. Electron bu...
The upcoming generation of hard X-ray free-electron lasers (XFEL) delivers X-raypulses with unmatche...
Abstract A combination of electro-optic detection of the Coulomb field of an electron bunch and sing...
In recent years, there has been increasing interest in short electron bunches for different applicat...