In this work the influence of non-uniformity effects on the spectral transmission properties of broad-band dielectric optical coatings was examined. Recently, it was observed that in modern complex dielectric coatings significant spectral, resonantlike errors of the reflected wavefront can occur at specific wavelengths, which are induced by lateral coating nonuniformities [1]. For a detailed investigation of this effect, a setup was developed for monitoring the spectrally dependent wavefront error, utilizing a broad-band monochromatized plasma lamp (spectral range from 400 – 900nm) as light source and a high sensitivity Hartmann-Shack wavefront sensor for detection of reflected or transmitted wavefronts. In addition, a method for absolute a...
Multi-layer optical coatings with complex spectrum requirements, such as multi-band pass filters, no...
The optical parameters (index of refraction and extinction coefficients—n and k) of various dielectr...
Broadband optical monitoring for thin-film filter manufacturing is more and more developed thanks to...
The present paper addresses uniformity effects in demanding dielectric optical coatings. The origins...
A broadband beam splitter coating with the reflecting range from 400 to 900 nm and the transmitting ...
An optical characterization method with high spectral resolution for broadband, multilayer dielectri...
Copyright © 2000 American Association of Physics Teachers.Some properties of the reflectivity and tr...
We consider a scattering system consisting of a dielectric film deposited on a semi-infinite metal, ...
The response of a medium with respect to electromagnetic fields is commonly described in terms of it...
Thesis (Ph.D.)--University of Rochester. College of Engineering and Applied Science. Institute of Op...
Copyright © 2000 American Association of Physics Teachers.Some properties of the reflectivity and tr...
A model for refractive index of stratified dielectric substrate was put forward according to theorie...
The work described in this thesis is concentrating on the high-accuracy characterization of optical ...
Multi-layer optical coatings with complex spectrum requirements, such as multi-band pass filters, no...
The analysis of reflections from thin films or dielectric materials can be approached by a matrix me...
Multi-layer optical coatings with complex spectrum requirements, such as multi-band pass filters, no...
The optical parameters (index of refraction and extinction coefficients—n and k) of various dielectr...
Broadband optical monitoring for thin-film filter manufacturing is more and more developed thanks to...
The present paper addresses uniformity effects in demanding dielectric optical coatings. The origins...
A broadband beam splitter coating with the reflecting range from 400 to 900 nm and the transmitting ...
An optical characterization method with high spectral resolution for broadband, multilayer dielectri...
Copyright © 2000 American Association of Physics Teachers.Some properties of the reflectivity and tr...
We consider a scattering system consisting of a dielectric film deposited on a semi-infinite metal, ...
The response of a medium with respect to electromagnetic fields is commonly described in terms of it...
Thesis (Ph.D.)--University of Rochester. College of Engineering and Applied Science. Institute of Op...
Copyright © 2000 American Association of Physics Teachers.Some properties of the reflectivity and tr...
A model for refractive index of stratified dielectric substrate was put forward according to theorie...
The work described in this thesis is concentrating on the high-accuracy characterization of optical ...
Multi-layer optical coatings with complex spectrum requirements, such as multi-band pass filters, no...
The analysis of reflections from thin films or dielectric materials can be approached by a matrix me...
Multi-layer optical coatings with complex spectrum requirements, such as multi-band pass filters, no...
The optical parameters (index of refraction and extinction coefficients—n and k) of various dielectr...
Broadband optical monitoring for thin-film filter manufacturing is more and more developed thanks to...