Optical waveguide propagation loss measurement method based on optical multiple reflections detection is presented in this paper. By using a precision reflectometer, uncertain influence on waveguide propagation loss measurement caused by fiber-waveguide coupling can be eliminated effectively and the waveguide net propagation loss can be measured accurately. To demonstrate this, the propagation loss of a Silicon-on-Insulator (SOI) rib waveguide fabricated by RIE is measured with the obtained value being 4.3 dB/cm. This method provides a non-destructive means for evaluating waveguide propagation loss. (c) 2005 Elsevier B.V. All rights reserved
Bending loss in silicon-on-insulator rib waveguides was calculated using conformal mapping of the cu...
Abstract—Silicon-on-insulator (SOI) optical waveguides insure high electromagnetic field confinement...
The photodeflection method applied to the propagation losses characterization in channel waveguides ...
A method to measure the propagation loss of optical waveguides is discussed. The measurement system ...
A novel method is presented to measure the propagation loss of integrated optical waveguides. The me...
Because optical waveguides naturally have loss, methods to measure loss have been developed. The ide...
We propose and demonstrate a nondestructive method for loss measurement in optical guided structures...
In this paper, a method for measuring waveguide propagation losses by means of a Mach-Zehnder Interf...
This thesis presents the realization of a characterization method for optical waveguides in terms o...
The propagation loss of a direct UV-written silica-on-silicon waveguide is measured using an elegant...
A new method for measuring waveguide propagation loss in silicon nanowires is presented. This method...
International audienceWe propose and demonstrate a nondestructive method for loss measurement in opt...
Waveguide propagation loss is a key parameter for integrated devices, yet characterisation of this p...
A new technique has been developed to measure optical losses of waveguide devices fabricated in III-...
We use star couplers to measure the relative scattering losses of silicon-on-insulator (SOI) ridge w...
Bending loss in silicon-on-insulator rib waveguides was calculated using conformal mapping of the cu...
Abstract—Silicon-on-insulator (SOI) optical waveguides insure high electromagnetic field confinement...
The photodeflection method applied to the propagation losses characterization in channel waveguides ...
A method to measure the propagation loss of optical waveguides is discussed. The measurement system ...
A novel method is presented to measure the propagation loss of integrated optical waveguides. The me...
Because optical waveguides naturally have loss, methods to measure loss have been developed. The ide...
We propose and demonstrate a nondestructive method for loss measurement in optical guided structures...
In this paper, a method for measuring waveguide propagation losses by means of a Mach-Zehnder Interf...
This thesis presents the realization of a characterization method for optical waveguides in terms o...
The propagation loss of a direct UV-written silica-on-silicon waveguide is measured using an elegant...
A new method for measuring waveguide propagation loss in silicon nanowires is presented. This method...
International audienceWe propose and demonstrate a nondestructive method for loss measurement in opt...
Waveguide propagation loss is a key parameter for integrated devices, yet characterisation of this p...
A new technique has been developed to measure optical losses of waveguide devices fabricated in III-...
We use star couplers to measure the relative scattering losses of silicon-on-insulator (SOI) ridge w...
Bending loss in silicon-on-insulator rib waveguides was calculated using conformal mapping of the cu...
Abstract—Silicon-on-insulator (SOI) optical waveguides insure high electromagnetic field confinement...
The photodeflection method applied to the propagation losses characterization in channel waveguides ...