The Dr. Probe software for multislice simulations of STEM images is introduced, and reference is given of the applied methods. Major program features available with the graphical user interface version are demonstrated by means of a few examples for bright-field and dark-field STEM imaging as well as simulations of diffraction patterns. The numerical procedure applied for the simulation of thermal-diffuse scattering by the frozen-lattice approach is described in detail. Intensity variations occurring in simulations with atomic-column resolution due to frozen-lattice variations are discussed in the context of atom counting. It is found that a significant averaging over many lattice configurations with different random atomic displacements is...
Abstract: Quantification of annular dark field (ADF) scanning transmission electron microscopy (STEM...
A hybrid statistics-simulations based method for atom-counting from annular dark field scanning tran...
Image simulation for scanning transmission electron microscopy at atomic resolution for samples with...
Scanning transmission electron microscopy (STEM), where a converged electron probe is scanned over a...
Scanning transmission electron microscopy (STEM), where a converged electron probe is scanned over a...
Scanning transmission electron microscopy (STEM) is an extremely versatile method for studying mater...
Scanning transmission electron microscopy (STEM) is an extremely versatile method for studying mater...
Image simulation for scanning transmission electron microscopy at atomic resolution for samples with...
Recently it has been shown that precise dose control and an increase in the overall acquisition spee...
Atomic configurations of glassy or amorphous materials containing medium-range order (MRO) may be id...
Scanning transmission electron microscopy images can be complex to interpret on the atomic scale as ...
In a Bloch-wave-based STEM image simulation, a framework for calculating the cross section for any i...
Multislice HAADF - STEM image simulations of SrTiO 3 are performed at 300 K.The procedure of these s...
Recently it has been shown that precise dose control and an increase in the overall acquisition spee...
In a dynamical STEM image simulation by the Bloch-wave method, Allen et al. formulated a framework f...
Abstract: Quantification of annular dark field (ADF) scanning transmission electron microscopy (STEM...
A hybrid statistics-simulations based method for atom-counting from annular dark field scanning tran...
Image simulation for scanning transmission electron microscopy at atomic resolution for samples with...
Scanning transmission electron microscopy (STEM), where a converged electron probe is scanned over a...
Scanning transmission electron microscopy (STEM), where a converged electron probe is scanned over a...
Scanning transmission electron microscopy (STEM) is an extremely versatile method for studying mater...
Scanning transmission electron microscopy (STEM) is an extremely versatile method for studying mater...
Image simulation for scanning transmission electron microscopy at atomic resolution for samples with...
Recently it has been shown that precise dose control and an increase in the overall acquisition spee...
Atomic configurations of glassy or amorphous materials containing medium-range order (MRO) may be id...
Scanning transmission electron microscopy images can be complex to interpret on the atomic scale as ...
In a Bloch-wave-based STEM image simulation, a framework for calculating the cross section for any i...
Multislice HAADF - STEM image simulations of SrTiO 3 are performed at 300 K.The procedure of these s...
Recently it has been shown that precise dose control and an increase in the overall acquisition spee...
In a dynamical STEM image simulation by the Bloch-wave method, Allen et al. formulated a framework f...
Abstract: Quantification of annular dark field (ADF) scanning transmission electron microscopy (STEM...
A hybrid statistics-simulations based method for atom-counting from annular dark field scanning tran...
Image simulation for scanning transmission electron microscopy at atomic resolution for samples with...