Add to ORKGWe have extended the technique of variable angle spectroscopic ellipsometry to measurement of the magneto-optical effects as a function of wavelength and angle of incidence and field strength. Results on DyCo multilayers are reported
This dissertation presents instrumentation developed for the optical characterizations of magneto-op...
Modern growth techniques allow for highly complex nano scale thin films to be created. These new fil...
[[abstract]]Coating technology has played an important role in optics, opto-electronics, semiconduct...
We have extended the technique of variable angle spectroscopic ellipsometry to measurement of the ma...
The purpose of this paper is twofold. First, we describe the adaptation of a variable angle spectros...
We have applied the technique of variable angle of incidence spectroscopic ellipsometry (VASE) to th...
Ellipsometric and magneto-optical properties of Dy (3.5 Å thick) and Fe (2.5–12.5 Å thick) multilaye...
Spectral ellipsometry technique is demonstrated to be a useful tool for the investigation of optical...
Enhanced Kerr rotation spectra are measured in thin magnetic layers on silver. Also, variable angle ...
[[abstract]]Two simple methods were introduced for measuring the magneto-optical Kerr rotation when ...
The manufacture of optical coatings, computer disks, as well as advanced electronic multilayered dev...
Objectives of this research are: (1) to measure the hysteresis loop, Kerr rotation angle, anisotropy...
Ellipsometry is particularly attractive for its suitability for in-situ measurements and remarkable ...
Spectroscopic ellipsometry and magneto-optic Kerr effects are measured on Pt/Co multilayers with a s...
This dissertation presents nondestructive optical characterization methods developed for thin films ...
This dissertation presents instrumentation developed for the optical characterizations of magneto-op...
Modern growth techniques allow for highly complex nano scale thin films to be created. These new fil...
[[abstract]]Coating technology has played an important role in optics, opto-electronics, semiconduct...
We have extended the technique of variable angle spectroscopic ellipsometry to measurement of the ma...
The purpose of this paper is twofold. First, we describe the adaptation of a variable angle spectros...
We have applied the technique of variable angle of incidence spectroscopic ellipsometry (VASE) to th...
Ellipsometric and magneto-optical properties of Dy (3.5 Å thick) and Fe (2.5–12.5 Å thick) multilaye...
Spectral ellipsometry technique is demonstrated to be a useful tool for the investigation of optical...
Enhanced Kerr rotation spectra are measured in thin magnetic layers on silver. Also, variable angle ...
[[abstract]]Two simple methods were introduced for measuring the magneto-optical Kerr rotation when ...
The manufacture of optical coatings, computer disks, as well as advanced electronic multilayered dev...
Objectives of this research are: (1) to measure the hysteresis loop, Kerr rotation angle, anisotropy...
Ellipsometry is particularly attractive for its suitability for in-situ measurements and remarkable ...
Spectroscopic ellipsometry and magneto-optic Kerr effects are measured on Pt/Co multilayers with a s...
This dissertation presents nondestructive optical characterization methods developed for thin films ...
This dissertation presents instrumentation developed for the optical characterizations of magneto-op...
Modern growth techniques allow for highly complex nano scale thin films to be created. These new fil...
[[abstract]]Coating technology has played an important role in optics, opto-electronics, semiconduct...