When mapping spatially resolved photoemission intensity for electron kinetic energy corresponding to Fermi energy, one obtains a spherical cut through a three-dimensional Fermi surface of a metal. At the APE-INFM beamline at Elettra, we developed an automated method of measuring the Fermi surface cuts for a large number of photon energies and putting them together in order to reconstruct the three-dimensional Fermi surface. The energy and k(parallel to) (momentum parallel to the surface) resolution are set by the monochromator and energy analyzer properties, while the k(perpendicular to) (momentum perpendicular to the surface) resolution depends on the photon energy step chosen for obtaining subsequent data sets. By 3D interpolation of the ...
We have studied the Fermi surface of Cu using an ellipsoidal-mirror analyzer which gives two-dimensi...
A velocity-map-imaging spectrometer is demonstrated to characterize the normalized emittance (root-m...
A velocity-map-imaging spectrometer is demonstrated to characterize the normalized emittance (root-m...
When mapping spatially resolved photoemission intensity for electron kinetic energy corresponding to...
When mapping spatially resolved photoemission intensity for electron kinetic energy corresponding to...
We describe the use of an ellipsoidal-mirror analyzer to obtain cross-sectional images of electrons ...
The discontinuity in the lattice periodic potential at surfaces often leads to the creation of new e...
The discontinuity in the lattice periodic potential at surfaces often leads to the creation of newel...
The discontinuity in the lattice periodic potential at surfaces often leads to the creation of newel...
A brief survey of the angle-scanned photoemission technique is given. It incorporates two complement...
We performed a full mapping of the bulk electronic structure including the Fermi surface and Fermi-v...
The setup of an electron spectrometer for angle-resolved photoemission is described. A sample goniom...
We demonstrate the use of a photoelectron emission microscope in connection with a retarding field e...
Angle-resolved photoemission spectroscopy (ARPES) has been commonly applied to evaluate the shape of...
Angle-resolved photoemission spectroscopy (ARPES) has been commonly applied to evaluate the shape of...
We have studied the Fermi surface of Cu using an ellipsoidal-mirror analyzer which gives two-dimensi...
A velocity-map-imaging spectrometer is demonstrated to characterize the normalized emittance (root-m...
A velocity-map-imaging spectrometer is demonstrated to characterize the normalized emittance (root-m...
When mapping spatially resolved photoemission intensity for electron kinetic energy corresponding to...
When mapping spatially resolved photoemission intensity for electron kinetic energy corresponding to...
We describe the use of an ellipsoidal-mirror analyzer to obtain cross-sectional images of electrons ...
The discontinuity in the lattice periodic potential at surfaces often leads to the creation of new e...
The discontinuity in the lattice periodic potential at surfaces often leads to the creation of newel...
The discontinuity in the lattice periodic potential at surfaces often leads to the creation of newel...
A brief survey of the angle-scanned photoemission technique is given. It incorporates two complement...
We performed a full mapping of the bulk electronic structure including the Fermi surface and Fermi-v...
The setup of an electron spectrometer for angle-resolved photoemission is described. A sample goniom...
We demonstrate the use of a photoelectron emission microscope in connection with a retarding field e...
Angle-resolved photoemission spectroscopy (ARPES) has been commonly applied to evaluate the shape of...
Angle-resolved photoemission spectroscopy (ARPES) has been commonly applied to evaluate the shape of...
We have studied the Fermi surface of Cu using an ellipsoidal-mirror analyzer which gives two-dimensi...
A velocity-map-imaging spectrometer is demonstrated to characterize the normalized emittance (root-m...
A velocity-map-imaging spectrometer is demonstrated to characterize the normalized emittance (root-m...