We have investigated the first stages of the room-temperature oxidation of the Si(100) surface combining experimental surface optical spectra with the results of ab initio calculations. High-resolution reflectance anisotropy spectra (RAS) and surface differential reflectance spectra (SDRS) have been measured for the clean surfaces and various exposures up to 183 L, which have been compared with calculated RAS and SDRS in the independent-particle approximation. Our results, yielding a consistent description of both RAS and SDRS, suggest the coexistence of different structural domains, whose weight changes smoothly with the oxygen exposure. The main oxidation mechanisms together with their occurrence versus coverage are discussed
We present ab initio calculations of electron energy loss spectroscopy in the reflection geometry (R...
By comparison of measured and ab initio calculated surface optical spectra we demonstrate that two ...
We have applied ambient-pressure x-ray photoelectron spectroscopy with Si 2p chemical shifts to stud...
We have investigated the first stages of the room-temperature oxidation of the Si(100) surface combi...
The effects of oxygen adsorption on the reflectance anisotropy spectrum (RAS) of reconstructed Si(10...
Electron energy loss spectra of the Si(100) and Si(100):O surfaces are investigated using ab initio ...
Electron energy loss spectra of the Si(100) and Si(100):O surfaces are investigated using ab initio ...
External differential reflection measurements were carried out on clean Si(100) and (110) surfaces i...
Auger electron spectroscopy is used to follow the initial chemisorption of oxygen on a Si(100)−2 × 1...
By comparison of measured and ab initio calculated surface optical spectra we demonstrate that two m...
This paper describes a study concerning the interaction of molecular oxygen (0,) and nitrous oxide (...
We have applied reflectance anisotropy spectroscopy (RAS) to investigate the rebonded-step (RS) reco...
We compute high-resolution electron energy loss spectra (HREELS) of possible structural motifs that ...
Auger electron spectroscopy is used to follow the initial chemisorption of oxygen on a Si(lOO)-2 x 1...
Normal incidence ellipsometry has been used to measure the change in the complex anisotropic reflect...
We present ab initio calculations of electron energy loss spectroscopy in the reflection geometry (R...
By comparison of measured and ab initio calculated surface optical spectra we demonstrate that two ...
We have applied ambient-pressure x-ray photoelectron spectroscopy with Si 2p chemical shifts to stud...
We have investigated the first stages of the room-temperature oxidation of the Si(100) surface combi...
The effects of oxygen adsorption on the reflectance anisotropy spectrum (RAS) of reconstructed Si(10...
Electron energy loss spectra of the Si(100) and Si(100):O surfaces are investigated using ab initio ...
Electron energy loss spectra of the Si(100) and Si(100):O surfaces are investigated using ab initio ...
External differential reflection measurements were carried out on clean Si(100) and (110) surfaces i...
Auger electron spectroscopy is used to follow the initial chemisorption of oxygen on a Si(100)−2 × 1...
By comparison of measured and ab initio calculated surface optical spectra we demonstrate that two m...
This paper describes a study concerning the interaction of molecular oxygen (0,) and nitrous oxide (...
We have applied reflectance anisotropy spectroscopy (RAS) to investigate the rebonded-step (RS) reco...
We compute high-resolution electron energy loss spectra (HREELS) of possible structural motifs that ...
Auger electron spectroscopy is used to follow the initial chemisorption of oxygen on a Si(lOO)-2 x 1...
Normal incidence ellipsometry has been used to measure the change in the complex anisotropic reflect...
We present ab initio calculations of electron energy loss spectroscopy in the reflection geometry (R...
By comparison of measured and ab initio calculated surface optical spectra we demonstrate that two ...
We have applied ambient-pressure x-ray photoelectron spectroscopy with Si 2p chemical shifts to stud...