Degradation of electrochromic thin films under extended charge insertion and extraction is a technically important phenomenon for which no in-depth understanding is currently on hand. Here, we report on an explorative study of sputter-deposited WO3 films in a Li-ion-conducting electrolyte by use of cyclic voltammetry, in situ optical transmittance, and impedance spectroscopy. A cycling-dependent decrease of the charge capacity could be accurately modeled by a power-law function, and impedance spectroscopy gave evidence for anomalous diffusion as well as a higher charge transfer resistance during deintercalation than during intercalation. Thus, a consistent conceptual picture emerged for the degradation dynamics; it includes the growth of an...
We report a series of electrochemical analysis of homogeneous a-LixWO3 films of 400 nm thickness pre...
We report a series of electrochemical analysis of homogeneous a-LixWO3 films of 400 nm thickness pre...
Amorphous tungsten oxide thinfilms were deposited by sputtering at different O2/Ar ratios onto condu...
Degradation of electrochromic thin films under extended charge insertion and extraction is a technic...
Degradation of electrochromic thin films under extended charge insertion and extraction is a technic...
Electrochemical analysis of a-LixWO3 films of 400 nm thick prepared by electron beam evaporation tec...
Electrochemical analysis of a-LixWO3 films of 400 nm thick prepared by electron beam evaporation tec...
Electrochemical analysis of a-LixWO3 films of 400 nm thick prepared by electron beam evaporation tec...
Ion trapping under charge insertion-extraction is well-known to degrade the electrochemical performa...
Ion trapping under charge insertion-extraction is well-known to degrade the electrochemical performa...
Ion trapping under charge insertion-extraction is well-known to degrade the electrochemical performa...
International audienceThere has been keen interest for years in the research of all-solid-state tran...
We report a series of electrochemical analysis of homogeneous a-LixWO3 films of 400 nm thickness pre...
We report a series of electrochemical analysis of homogeneous a-LixWO3 films of 400 nm thickness pre...
We report a series of electrochemical analysis of homogeneous a-LixWO3 films of 400 nm thickness pre...
We report a series of electrochemical analysis of homogeneous a-LixWO3 films of 400 nm thickness pre...
We report a series of electrochemical analysis of homogeneous a-LixWO3 films of 400 nm thickness pre...
Amorphous tungsten oxide thinfilms were deposited by sputtering at different O2/Ar ratios onto condu...
Degradation of electrochromic thin films under extended charge insertion and extraction is a technic...
Degradation of electrochromic thin films under extended charge insertion and extraction is a technic...
Electrochemical analysis of a-LixWO3 films of 400 nm thick prepared by electron beam evaporation tec...
Electrochemical analysis of a-LixWO3 films of 400 nm thick prepared by electron beam evaporation tec...
Electrochemical analysis of a-LixWO3 films of 400 nm thick prepared by electron beam evaporation tec...
Ion trapping under charge insertion-extraction is well-known to degrade the electrochemical performa...
Ion trapping under charge insertion-extraction is well-known to degrade the electrochemical performa...
Ion trapping under charge insertion-extraction is well-known to degrade the electrochemical performa...
International audienceThere has been keen interest for years in the research of all-solid-state tran...
We report a series of electrochemical analysis of homogeneous a-LixWO3 films of 400 nm thickness pre...
We report a series of electrochemical analysis of homogeneous a-LixWO3 films of 400 nm thickness pre...
We report a series of electrochemical analysis of homogeneous a-LixWO3 films of 400 nm thickness pre...
We report a series of electrochemical analysis of homogeneous a-LixWO3 films of 400 nm thickness pre...
We report a series of electrochemical analysis of homogeneous a-LixWO3 films of 400 nm thickness pre...
Amorphous tungsten oxide thinfilms were deposited by sputtering at different O2/Ar ratios onto condu...