To face future reliability challenges, it is necessary to quantify the risk of error in any part of a computing system. To this goal, the Architectural Vulnerability Factor (AVF) has long been used for chips. However, this metric is used for offline characterisation, which is inappropriate for memory. We survey the literature and formalise one of the metrics used, the Memory Vulnerability Factor, and extend it to take into account false errors. These are reported errors which would have no impact on the program if they were ignored. We measure the False Error Aware MVF (FEA) and related metrics precisely in a cycle-accurate simulator, and compare them with the effects of injecting faults in a program's data, in native parallel runs. Our fin...
Aggressive technology scaling is increasing the impact of soft errors on microprocessor reliability....
This paper presents a first-order analytical model for determining the performance degradation cause...
Thesis (Ph. D.)--University of Rochester. Dept. of Electrical and Computer Engineering, 2012In moder...
To face future reliability challenges, it is necessary to quantify the risk of error in any part of ...
Fault injection studies and vulnerability analyses have been used to estimate the reliability of dat...
Abstract-The notion of Architectural Vulnerability Factor (AVF) has been extensively used to evaluat...
Abstract—Soft Errors have emerged as a key challenge to microprocessor design. Traditional soft erro...
Single-event upsets from particle strikes have become a key challenge in microprocessor design. Tech...
Reliability to soft errors is a significant design challenge in modern microprocessors owing to an e...
Soft error reliability has become a first-order design criterion for modern microprocessors. Archite...
Reliability is becoming a major design concern in contemporary microprocessors since soft error rate...
Shrinking semiconductor technologies come at the cost of higher susceptibility to hardware faults t...
Soft errors are a growing concern for processor reliability. Recent work has motivated architecture ...
Abstract—Reliability is an important design constraint in modern microprocessors, and one of the fun...
Abstract—As CMOS technology scales into the nanometer era, future shipped microprocessors will be in...
Aggressive technology scaling is increasing the impact of soft errors on microprocessor reliability....
This paper presents a first-order analytical model for determining the performance degradation cause...
Thesis (Ph. D.)--University of Rochester. Dept. of Electrical and Computer Engineering, 2012In moder...
To face future reliability challenges, it is necessary to quantify the risk of error in any part of ...
Fault injection studies and vulnerability analyses have been used to estimate the reliability of dat...
Abstract-The notion of Architectural Vulnerability Factor (AVF) has been extensively used to evaluat...
Abstract—Soft Errors have emerged as a key challenge to microprocessor design. Traditional soft erro...
Single-event upsets from particle strikes have become a key challenge in microprocessor design. Tech...
Reliability to soft errors is a significant design challenge in modern microprocessors owing to an e...
Soft error reliability has become a first-order design criterion for modern microprocessors. Archite...
Reliability is becoming a major design concern in contemporary microprocessors since soft error rate...
Shrinking semiconductor technologies come at the cost of higher susceptibility to hardware faults t...
Soft errors are a growing concern for processor reliability. Recent work has motivated architecture ...
Abstract—Reliability is an important design constraint in modern microprocessors, and one of the fun...
Abstract—As CMOS technology scales into the nanometer era, future shipped microprocessors will be in...
Aggressive technology scaling is increasing the impact of soft errors on microprocessor reliability....
This paper presents a first-order analytical model for determining the performance degradation cause...
Thesis (Ph. D.)--University of Rochester. Dept. of Electrical and Computer Engineering, 2012In moder...