Defect Analysis of BaSrFBr:Eu Irradiated by X-ray

The mechanical property of the BaSrFBr:Eu phosphor layer of X-ray image plates was investigated by using image quality (IQ), resolution (LP/mm), and coincidence Doppler broadening (CDB) positron annihilation. The screen samples of BaSrFBr:Eu phosphors were irradiated with hospital X-rays in the course of diagnostic radiography at an average rate of 20,000 times per year and were used for various periods of time. The LP/mm values of the irradiated BaSrFBr:Eu image plates varied between 2.4 and 2.0 for three years while the IQ values varied between 35 and 11 over the same period. CDB positron annihilation spectroscopy was used to analyze the defect structures in the phosphor layer. The S parameter values increased in correlation with increased exposure time, which indicated that more defects were generated. There was a positive relationship between the IQ and S parameters. Measurements of the defects indicate that most of the defects were likely to have been generated by the X-ray radiation.This research is supported by the 2009 Hannam University Research Fund and by # 20090074489 at National Research of Foundation. We also thank Cyclotron User Research and the medical doctors at Konyang University Hospital