Electrical Bistability Mechanisms of Organic Bistable Devices Fabricated Utilizing Ni1-xFex Self-Assembled Nanoparticles Embedded in a Polyimide Layer

Current-voltage (I-V) measurements on Al/Ni1-xFex nanoparticles embedded in polyimide/Al devices at 300 K showed a current bistability due to the existence of Ni1-xFex nanoparticles. The ON/OFF current ratio for the fabricated devices was about 10(2). The retention time data of the devices demonstrated charge trapping and detrapping processes. Carrier transport mechanisms of the devices are described on the basis of the I-V experimental and fitting results. (C) 2010 The Japan Society of Applied PhysicsThis work was supported by the Korea Science and Engineering Foundation (KOSEF) grant funded by the Korea government (MEST) (No. R0A-2007-000-20044-0) and also by a grant (code: 2009K000474) from "Center for Nanostrucutred Materials Technology'' under "21st Century Frontier R&D Programs'' of the Ministry of Education, Science and Technology, Korea