Silicon cantilever arrays with a very small pitch for parallel AFM operations were studied. We fabricated 1x104 in eight groups and 1x30 Si probe arrays and produced a smaller pitch (15 mu m) between probe tips by using Si anisotropic etching with a vertical wall shaped oxide mask. The vertical controls of Si probes were able to operate individually or in a group by integrating electrostatic actuators into the cantilevers of the probes. The fabricated Si cantilever arrays showed reasonable dynamic characteristics for the probe cantilever and reliable parallel operation of AFM
Microcantilevers are used in a number of applications including atomic-force microscopy (AFM). In th...
AbstractMicrocantilevers are used in a number of applications including atomic-force microscopy (AFM...
An atomic force microscope (AFM) system with multiple parallel lithography probes of equal heights o...
In this paper a micromachining method for batch fabrication of in-plane atomic force microscope (AFM...
A cantilever transducer system with platinum tip electrodes in sub micron regime has been fabricated...
AbstractConcept, design and realization of cantilever arrays probes with self-sensing and self-actua...
International audienceA family of silicon micro-sensors for Atomic Force Microscope (AFM) is present...
AbstractWe present 2D cantilever arrays for parallel AFM and their fabrication process using a silic...
A monocrystalline silicon lever with an integrated silicon tip for a Force/Friction Microscope was r...
Since the invention of atomic force microscopy (AFM) researchers have been trying to increase imagin...
<div class="abstract-content formatted"><p class="a-plus-plus">A simple, high yield method for the f...
As a first step to realize novel cantilevers to be used in the atomic force microscopy (AFM), we hav...
A fabrication process for realising two-dimensional cantilever arrays for parallel force spectroscop...
This paper describes an improved design for a monolithic silicon atomic force microscope (AFM) probe...
Atomic force microscopy (AFM) investigations of living cells provide new information in both biology...
Microcantilevers are used in a number of applications including atomic-force microscopy (AFM). In th...
AbstractMicrocantilevers are used in a number of applications including atomic-force microscopy (AFM...
An atomic force microscope (AFM) system with multiple parallel lithography probes of equal heights o...
In this paper a micromachining method for batch fabrication of in-plane atomic force microscope (AFM...
A cantilever transducer system with platinum tip electrodes in sub micron regime has been fabricated...
AbstractConcept, design and realization of cantilever arrays probes with self-sensing and self-actua...
International audienceA family of silicon micro-sensors for Atomic Force Microscope (AFM) is present...
AbstractWe present 2D cantilever arrays for parallel AFM and their fabrication process using a silic...
A monocrystalline silicon lever with an integrated silicon tip for a Force/Friction Microscope was r...
Since the invention of atomic force microscopy (AFM) researchers have been trying to increase imagin...
<div class="abstract-content formatted"><p class="a-plus-plus">A simple, high yield method for the f...
As a first step to realize novel cantilevers to be used in the atomic force microscopy (AFM), we hav...
A fabrication process for realising two-dimensional cantilever arrays for parallel force spectroscop...
This paper describes an improved design for a monolithic silicon atomic force microscope (AFM) probe...
Atomic force microscopy (AFM) investigations of living cells provide new information in both biology...
Microcantilevers are used in a number of applications including atomic-force microscopy (AFM). In th...
AbstractMicrocantilevers are used in a number of applications including atomic-force microscopy (AFM...
An atomic force microscope (AFM) system with multiple parallel lithography probes of equal heights o...