This paper presents the integrated circuit design, targeting a CMOS 65 nm 1.2 V technology, of a high-speed driver that provides the differential input signals to a Mach Zender Modulator (MZM), and allows tuning of the MZM operating point through adjustment of the bias voltage. A multi-voltage domain circuit is proposed, where each domain is isolated through deep n-well trenches, to face the high voltage swing and the bias regulation requirements of the MZM. The MZM device, whose prototype has been implemented in silicon photonics iSiPP50G technology, is emerging as a promising solution for radiation tolerant, several hundreds of Mrad, and high-speed, in the range of 10 Gbps, optical links. These stringent requirements are needed in high en...
The paper presents the design and the performance characterization, through system-level bit error r...
This paper presents the design and experimental verification of two drivers designed to be compliant...
This paper presents the design and experimental verification of two drivers designed to be compliant...
This paper presents the integrated circuit design, targeting a CMOS 65 nm 1.2 V technology, of a hig...
Radiations in harsh environments can significantly affects the performance of the silicon devices. T...
Radiations in harsh environments can significantly affects the performance of the silicon devices. T...
This work presents a design of a driver in 65 nm TSMC technology for a custom MZM designed to withst...
This work presents a design of a driver in 65 nm TSMC technology for a custom MZM designed to withst...
This work presents a design of a driver in 65 nm TSMC technology for a custom MZM designed to withst...
This work presents a design of a driver in 65 nm TSMC technology for a custom MZM designed to withst...
This work presents a design of a driver in 65 nm TSMC technology for a custom MZM designed to withst...
The paper presents the design and the performance characterization, through system-level bit error r...
The paper presents the design and the performance characterization, through system-level bit error r...
The paper presents the design and the performance characterization, through system-level bit error r...
The paper presents the design and the performance characterization, through system-level bit error r...
The paper presents the design and the performance characterization, through system-level bit error r...
This paper presents the design and experimental verification of two drivers designed to be compliant...
This paper presents the design and experimental verification of two drivers designed to be compliant...
This paper presents the integrated circuit design, targeting a CMOS 65 nm 1.2 V technology, of a hig...
Radiations in harsh environments can significantly affects the performance of the silicon devices. T...
Radiations in harsh environments can significantly affects the performance of the silicon devices. T...
This work presents a design of a driver in 65 nm TSMC technology for a custom MZM designed to withst...
This work presents a design of a driver in 65 nm TSMC technology for a custom MZM designed to withst...
This work presents a design of a driver in 65 nm TSMC technology for a custom MZM designed to withst...
This work presents a design of a driver in 65 nm TSMC technology for a custom MZM designed to withst...
This work presents a design of a driver in 65 nm TSMC technology for a custom MZM designed to withst...
The paper presents the design and the performance characterization, through system-level bit error r...
The paper presents the design and the performance characterization, through system-level bit error r...
The paper presents the design and the performance characterization, through system-level bit error r...
The paper presents the design and the performance characterization, through system-level bit error r...
The paper presents the design and the performance characterization, through system-level bit error r...
This paper presents the design and experimental verification of two drivers designed to be compliant...
This paper presents the design and experimental verification of two drivers designed to be compliant...