The present work deals with a new technique to produce complex micro- and nano-scale patterns with high accuracy by FIB micro machining. The proposed method is related to the production of stream file, which is optimized through a software interface. A unique sampling approach is used to optimize the conversion from a 3D meshed CAD object to the focused ion beam (FIB) digital to analogue converter (DAC). The method uses a novel scan strategy, sensitive to the pattern local geometry and size, to define the optimal ion beam path, dwell time and the scanning pitch. This not only allows to minimize the redeposition but also to obtain accurate and scalable milling routines. In order to show the applicability of the method, a hemisphere and a pyr...
We present a method of preparation of transmission electron microscopy (TEM) specimens of nano-elect...
In this work, two kinds of freeform micro optics were successfully fabricated by using focused ion b...
In this paper the possibilities of focused ion beam (FIB) applications in microsystem technology are...
The present work deals with a new technique to produce complex micro- and nano-scale patterns with h...
Abstract: The realization of complex three-dimensional structures at micro- and nanometre scale in v...
Focused ion beam (FIB) systems are being increasingly used for many highly demanding fabrication app...
The major interest in Focused Ion Beam (FIB) has been driven by the potential of the process to enab...
In this paper, the major factors which cause fabrication divergence in the focused ion beam (FIB) mi...
Focused ion beam (FIB) sputtering is used to shape a variety of cutting tools with dimensions in the...
With the ever-decreasing size of manufactured objects, fabrication processes driven by charged parti...
Fabrication of micro and nanoscale components are in high demand for various applications in divers...
Focused Ion Beams (FIB) systems are employed for their ability to manipulate and remove material on ...
This paper experimentally demonstrates that a quantitative description of focused ion beam (FIB) mil...
This report introduced focused ion beam (FIB) micromachining as a potential technique to fabricate B...
Todays focused ion beam (FIB) systems enable the fast and flexible fabrication of 3D structures with...
We present a method of preparation of transmission electron microscopy (TEM) specimens of nano-elect...
In this work, two kinds of freeform micro optics were successfully fabricated by using focused ion b...
In this paper the possibilities of focused ion beam (FIB) applications in microsystem technology are...
The present work deals with a new technique to produce complex micro- and nano-scale patterns with h...
Abstract: The realization of complex three-dimensional structures at micro- and nanometre scale in v...
Focused ion beam (FIB) systems are being increasingly used for many highly demanding fabrication app...
The major interest in Focused Ion Beam (FIB) has been driven by the potential of the process to enab...
In this paper, the major factors which cause fabrication divergence in the focused ion beam (FIB) mi...
Focused ion beam (FIB) sputtering is used to shape a variety of cutting tools with dimensions in the...
With the ever-decreasing size of manufactured objects, fabrication processes driven by charged parti...
Fabrication of micro and nanoscale components are in high demand for various applications in divers...
Focused Ion Beams (FIB) systems are employed for their ability to manipulate and remove material on ...
This paper experimentally demonstrates that a quantitative description of focused ion beam (FIB) mil...
This report introduced focused ion beam (FIB) micromachining as a potential technique to fabricate B...
Todays focused ion beam (FIB) systems enable the fast and flexible fabrication of 3D structures with...
We present a method of preparation of transmission electron microscopy (TEM) specimens of nano-elect...
In this work, two kinds of freeform micro optics were successfully fabricated by using focused ion b...
In this paper the possibilities of focused ion beam (FIB) applications in microsystem technology are...