An implementation of a design for testability model for sequential circuits is presented. The flip-flops in a sequential circuit are partitioned to reduce the number of cycles and the path lengths in each partition, thereby reducing the complexity of test generation. The implementation includes a Podem-based test generator. Preliminary results using the Contest sequential test generator are presented
One method of reducing the difficulty of test generation for sequential circuits is by the use of fu...
poses a difficult problem for circuits implemented from finite-state ma-chines. The flip-flops in se...
In previous studies clock control has been inserted after design to improve the testability of a seq...
An implementation of a design for testability model for sequential circuits is presented. The flip-f...
An implementation of a design for testability model for sequential circuits is presented. The jlip-j...
We propose a novel design for testability method that enhances the controllability of storage elemen...
The testability of a sequential circuit can be improved by controlling the clocks of individual stor...
Test generation for sequential VLSI circuits has remained a formidable problem to solve. The problem...
This paper presents a switch-level test generation system for synchronous sequential circuits in whi...
This paper presents a new method for sequential testability based on clock controlling. First, we de...
Random pattern testing methods are known to result in poor fault coverage for most sequential circui...
Several classes of sequential circuits with combinational test generation complexity have been intro...
This paper introduces a new class of sequential circuits called acyclically testable sequential circ...
We present a method of test generation for acyclic sequential circuits with hold registers. A comple...
Several classes of sequential circuits with combinational test generation complexity have been intro...
One method of reducing the difficulty of test generation for sequential circuits is by the use of fu...
poses a difficult problem for circuits implemented from finite-state ma-chines. The flip-flops in se...
In previous studies clock control has been inserted after design to improve the testability of a seq...
An implementation of a design for testability model for sequential circuits is presented. The flip-f...
An implementation of a design for testability model for sequential circuits is presented. The jlip-j...
We propose a novel design for testability method that enhances the controllability of storage elemen...
The testability of a sequential circuit can be improved by controlling the clocks of individual stor...
Test generation for sequential VLSI circuits has remained a formidable problem to solve. The problem...
This paper presents a switch-level test generation system for synchronous sequential circuits in whi...
This paper presents a new method for sequential testability based on clock controlling. First, we de...
Random pattern testing methods are known to result in poor fault coverage for most sequential circui...
Several classes of sequential circuits with combinational test generation complexity have been intro...
This paper introduces a new class of sequential circuits called acyclically testable sequential circ...
We present a method of test generation for acyclic sequential circuits with hold registers. A comple...
Several classes of sequential circuits with combinational test generation complexity have been intro...
One method of reducing the difficulty of test generation for sequential circuits is by the use of fu...
poses a difficult problem for circuits implemented from finite-state ma-chines. The flip-flops in se...
In previous studies clock control has been inserted after design to improve the testability of a seq...
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