Variabilities associated with CMOS evolution affect the yield and performance of current digital designs. FPGAs, which are widely used for fast prototyping and implementation of digital circuits, also suffer from these issues. Proactive approaches start to appear to achieve self-awareness and dynamic adaptation of these devices. To support these techniques we propose the employment of a multi-purpose sensor network. This infrastructure, through adequate use of configuration and automation tools, is able to obtain relevant data along the life cycle of an FPGA. This is realised at a very reduced cost, not only in terms of area or other limited resources, but also regarding the design effort required to define and deploy the measuring infrastr...
An all-digital self-adaptive clock generation system capable of adapt the clock frequency to compens...
Process variability is a challenging fabrication issue impacting, mainly, the reliability and perfor...
Both random and systematic within-die process variations (PV) are growing more severe with shrinking...
This paper presents a novel self-timed multi-purpose sensor especially conceived for Field Programma...
This paper presents a novel self-timed multi-purpose sensor especially conceived for Field Programma...
As technology node continues to shrink to achieve higher performance at high density, it has become ...
Current nanometer technologies are subjected to several adverse effects that seriously impact the yi...
The mitigation of process variability becomes paramount as chip fabrication advances deeper into the...
This research thesis aims to develop a system composed by a a CMOS power amplifier and built-in sens...
This thesis examines new timing measurement methods for self delay characterisation of Field-Program...
This thesis examines new timing measurement methods for self delay characterisation of Field-Program...
International audienceModern Field Programmable Gate Arrays (FP-GAs) are built using the most advanc...
Dependability issues due to non functional properties are emerging as major cause of faults in moder...
As CMOS technology scales down, Process, Voltage, Temperature and Ageing (PVTA) variations have an i...
In sub-nanometer complementary metal oxide emiconductor (CMOS) technologies, process variability str...
An all-digital self-adaptive clock generation system capable of adapt the clock frequency to compens...
Process variability is a challenging fabrication issue impacting, mainly, the reliability and perfor...
Both random and systematic within-die process variations (PV) are growing more severe with shrinking...
This paper presents a novel self-timed multi-purpose sensor especially conceived for Field Programma...
This paper presents a novel self-timed multi-purpose sensor especially conceived for Field Programma...
As technology node continues to shrink to achieve higher performance at high density, it has become ...
Current nanometer technologies are subjected to several adverse effects that seriously impact the yi...
The mitigation of process variability becomes paramount as chip fabrication advances deeper into the...
This research thesis aims to develop a system composed by a a CMOS power amplifier and built-in sens...
This thesis examines new timing measurement methods for self delay characterisation of Field-Program...
This thesis examines new timing measurement methods for self delay characterisation of Field-Program...
International audienceModern Field Programmable Gate Arrays (FP-GAs) are built using the most advanc...
Dependability issues due to non functional properties are emerging as major cause of faults in moder...
As CMOS technology scales down, Process, Voltage, Temperature and Ageing (PVTA) variations have an i...
In sub-nanometer complementary metal oxide emiconductor (CMOS) technologies, process variability str...
An all-digital self-adaptive clock generation system capable of adapt the clock frequency to compens...
Process variability is a challenging fabrication issue impacting, mainly, the reliability and perfor...
Both random and systematic within-die process variations (PV) are growing more severe with shrinking...