Interface dilution and morphology of CdTe/MnTe superlattices studied by small angle X-ray scattering

International audienceWe have performed small angle X-ray reflectivity measurements on CdTe/MnTe superlattices. The Fresnel optical method and the distorted wave Born approximation were used to extract results from the data. The reflectivity shows that the interface roughness (about 7 Å) is quite large for (43 ML CdTe/8 ML MnTe) and (34 ML CdTe/16 ML MnTe) samples. The effective MnTe concentration is determined from the refractive index. A model of correlated interface profiles is successfully used to simulate the diffuse scattering, and to determine the lateral correlation length of the roughness (Λ| = 1500 ± 750 Å); moreover, we demonstrate that the layers are almost completely correlated over the sample thickness in the growth direction