The subject paper presents new approach to response data compaction of multi-output digital circuits using two-input nonlinear logic with the objective of designing zeroaliasing (aliasing-free) space compression hardware for single stuck-line faults, extending well-known concept of conventional switching theory, viz. that of compatibility relation as used in the minimization of incompletely specified sequential machines. For a pair of response data outputs of the circuit under test (CUT), the method introduces the notion of fault detection compatibility and conditional fault detection compatibility (conditional upon some other pair of response data outputs being simultaneously fault detection compatible) with respect to two-input AND/NAND a...
We present a non-intrusive concurrent error detection (CED) method for combinational and sequential ...
Quaternary logic has the ability to be faster and consume less energy than conventional CMOS logic. ...
[[abstract]]Test set compaction for combinational circuits is studied in this paper. Two active comp...
Implementing aliasing-free (zero-aliasing) space compressors for built-in self-testing of very large...
The design of space-efficient support hardware for built-in self-testing (BIST) is of critical impor...
The present thesis deals with the general problem of designing and analyzing efficient space compres...
This thesis deals with response compaction techniques of BIST of VLSI circuits which translates into...
In recent years, many test output data compression techniques have been introduced, which reduce the...
Linear output space compression (OSC), or group parity prediction, of a circuit under check (CUC) is...
Built-in self-testing (BIST) is a design process that provides the capability of solving many of the...
[[abstract]]We present a Linear Feedback Shift Register (LFSR) like architecture, because the LFSR c...
This paper presents a novel approach to compact-ing a test response for a multiple scan chains de-si...
textThis paper investigates the cost-tradeoffs of implementing a test data compression technique pr...
In this paper a new structural method for linear output space compaction is presented. The method is...
The design is given for a Data Compression System which utilizes the latest Large Scale Integrated c...
We present a non-intrusive concurrent error detection (CED) method for combinational and sequential ...
Quaternary logic has the ability to be faster and consume less energy than conventional CMOS logic. ...
[[abstract]]Test set compaction for combinational circuits is studied in this paper. Two active comp...
Implementing aliasing-free (zero-aliasing) space compressors for built-in self-testing of very large...
The design of space-efficient support hardware for built-in self-testing (BIST) is of critical impor...
The present thesis deals with the general problem of designing and analyzing efficient space compres...
This thesis deals with response compaction techniques of BIST of VLSI circuits which translates into...
In recent years, many test output data compression techniques have been introduced, which reduce the...
Linear output space compression (OSC), or group parity prediction, of a circuit under check (CUC) is...
Built-in self-testing (BIST) is a design process that provides the capability of solving many of the...
[[abstract]]We present a Linear Feedback Shift Register (LFSR) like architecture, because the LFSR c...
This paper presents a novel approach to compact-ing a test response for a multiple scan chains de-si...
textThis paper investigates the cost-tradeoffs of implementing a test data compression technique pr...
In this paper a new structural method for linear output space compaction is presented. The method is...
The design is given for a Data Compression System which utilizes the latest Large Scale Integrated c...
We present a non-intrusive concurrent error detection (CED) method for combinational and sequential ...
Quaternary logic has the ability to be faster and consume less energy than conventional CMOS logic. ...
[[abstract]]Test set compaction for combinational circuits is studied in this paper. Two active comp...