This paper describes gate work function and oxide thickness tuning to realize novel circuits using dual-Vth independent-gate FinFETs. Dual-Vth FinFETs with independent gates enable series and parallel merge transformations in logic gates, realizing compact low power alternatives. Furthermore, they also enable the design of a new class of compact logic gates with higher expressive power and flexibility than conventional forms, e.g., implementing 12 unique Boolean functions using only four transistors. The gates are designed and calibrated using the University of Florida double-gate model into a technology library. Synthesis results for 14 benchmark circuits from the ISCAS and OpenSPARC suites indicate that on average, the enhanced...
Abstract—FinFET technology has been proposed as a promising alternative for deep sub-micron CMOS tec...
In this paper we propose double gate transistor i.e. FINFETS circuits. It is the substitute of bulk ...
Scaling of the MOSFET face greater challenge by extreme power density due to leakage current in ultr...
Scaling of the standard single-gate bulk MOSFETs faces great challenges in the nanometer regime due ...
Scaling of single-gate bulk MOSFET faces great challenges in the nanometer regime due to the severe ...
Abstract—FinFET technology has been proposed as a promising alternative for deep sub-micron CMOS tec...
Abstract—Scaling of the standard single-gate bulk MOSFETs faces great challenges in the nanometer re...
The Independent-Gate FinFET is introduced as a novel device structure that combines several innovati...
Brute-force sequential circuits with reduced clock load and simpler circuitry are widely used in the...
Circuits with transistors using independently controlled gates have been proposed to reduce the numb...
The Independent-Gate FinFET is introduced as a novel device structure that combines several innovati...
Structural renovation in transistor and circuit architectures has historically alleviated the power ...
Various circuit topologies and FinFET technology options for implementing brute-force latches are ex...
We extend ambipolar silicon nanowire transistors by using three independent gates and show an effici...
Scaling of single-gate MOSFET faces great challenges in the nanometer regime due to the severe short...
Abstract—FinFET technology has been proposed as a promising alternative for deep sub-micron CMOS tec...
In this paper we propose double gate transistor i.e. FINFETS circuits. It is the substitute of bulk ...
Scaling of the MOSFET face greater challenge by extreme power density due to leakage current in ultr...
Scaling of the standard single-gate bulk MOSFETs faces great challenges in the nanometer regime due ...
Scaling of single-gate bulk MOSFET faces great challenges in the nanometer regime due to the severe ...
Abstract—FinFET technology has been proposed as a promising alternative for deep sub-micron CMOS tec...
Abstract—Scaling of the standard single-gate bulk MOSFETs faces great challenges in the nanometer re...
The Independent-Gate FinFET is introduced as a novel device structure that combines several innovati...
Brute-force sequential circuits with reduced clock load and simpler circuitry are widely used in the...
Circuits with transistors using independently controlled gates have been proposed to reduce the numb...
The Independent-Gate FinFET is introduced as a novel device structure that combines several innovati...
Structural renovation in transistor and circuit architectures has historically alleviated the power ...
Various circuit topologies and FinFET technology options for implementing brute-force latches are ex...
We extend ambipolar silicon nanowire transistors by using three independent gates and show an effici...
Scaling of single-gate MOSFET faces great challenges in the nanometer regime due to the severe short...
Abstract—FinFET technology has been proposed as a promising alternative for deep sub-micron CMOS tec...
In this paper we propose double gate transistor i.e. FINFETS circuits. It is the substitute of bulk ...
Scaling of the MOSFET face greater challenge by extreme power density due to leakage current in ultr...