Electron inelastic mean free paths for carbon nanotubes from optical data

We present a simple model dielectric response function for both bulk and individual carbon nanotubes based on a parameterization of experimental optical data and analytic dispersion relations that account for dimensionality and linewidth broadening. The model is used to calculate electron inelastic mean free paths over a broad energy range of interest to various applications.Financial support for D.E., I.K., and K.K. was given by the European Union FP7 ANTICARB (Grant No. HEALTHF2-2008-201587) and for RGM and IA by the Spanish Ministerio de Ciencia e Innovación (Project Nos. FIS2006-13309-C02-01 and FIS2006-13309-C02-02)