20th IET Irish Signals and Systems Conference (ISSC), Dublin, Ireland, June, 2009A system for soft error detection and correction is proposed for digital Integrated Circuit (IC) implementation of convolution. The convolution is implemented in a Residue NumberSystem using Fermat Number Theoretic Transforms. The flexibility afforded by the Modified Overlap Technique in allowing transforms of differing lengths in a convolution makes it possible to easily detect and correct soft errors by means of a Single Redundant Channel and pattern matching technique. The proposed system gives area reductions in the majority of cases examined, when compared with Triple Modular Redundancy. In the case of large (e.g. 28 and 32 bit) word lengths, the proposed ...
Les effets dus à la radiation peuvent provoquer des pannes dans des circuits intégrés. Lorsqu'une pa...
In this paper, we address the issue of soft errors in random logic and develop solutions that provid...
dissertationCurrent scaling trends in transistor technology, in pursuit of larger component counts a...
20th IET Irish Signals and Systems Conference (ISSC), Dublin, Ireland, June, 2009A system for soft e...
23nd IET Irish Signals and Systems Conference, 28th - 29th June 2012, MaynoothA novel Concurrent Err...
In this paper, a novel low-complexity Concurrent Error Detection (CED) technique for Fast Fourier Tr...
Error mitigation techniques, such as Triple Modular Redundancy, introduce very large overheads. To a...
International audienceThe conjugate gradient (CG) method is the most widely used iterative scheme fo...
Digital filters are mainly used in signal processing and communication systems. Soft errors are majo...
[[abstract]]The soft error problem in digital circuits is becoming increasingly important as the IC ...
As technology scaling increases computer memory’s bit-cell density and reduces the voltage of semico...
International audienceWith the rapid size shrinking in electronic devices,radiation-induced soft-err...
Soft errors are becoming an important issue for deep submicron technologies. To protect circuits aga...
A parallel architecture for computation of the linear convolution of two sequences of arbitrary leng...
The main objective of this thesis is to develop techniques that can beused to analyze and mitigate t...
Les effets dus à la radiation peuvent provoquer des pannes dans des circuits intégrés. Lorsqu'une pa...
In this paper, we address the issue of soft errors in random logic and develop solutions that provid...
dissertationCurrent scaling trends in transistor technology, in pursuit of larger component counts a...
20th IET Irish Signals and Systems Conference (ISSC), Dublin, Ireland, June, 2009A system for soft e...
23nd IET Irish Signals and Systems Conference, 28th - 29th June 2012, MaynoothA novel Concurrent Err...
In this paper, a novel low-complexity Concurrent Error Detection (CED) technique for Fast Fourier Tr...
Error mitigation techniques, such as Triple Modular Redundancy, introduce very large overheads. To a...
International audienceThe conjugate gradient (CG) method is the most widely used iterative scheme fo...
Digital filters are mainly used in signal processing and communication systems. Soft errors are majo...
[[abstract]]The soft error problem in digital circuits is becoming increasingly important as the IC ...
As technology scaling increases computer memory’s bit-cell density and reduces the voltage of semico...
International audienceWith the rapid size shrinking in electronic devices,radiation-induced soft-err...
Soft errors are becoming an important issue for deep submicron technologies. To protect circuits aga...
A parallel architecture for computation of the linear convolution of two sequences of arbitrary leng...
The main objective of this thesis is to develop techniques that can beused to analyze and mitigate t...
Les effets dus à la radiation peuvent provoquer des pannes dans des circuits intégrés. Lorsqu'une pa...
In this paper, we address the issue of soft errors in random logic and develop solutions that provid...
dissertationCurrent scaling trends in transistor technology, in pursuit of larger component counts a...