Add to ORKGThe authors report determination of interlayer composition with subnanometer sensitivity at the buried interfaces using soft x-ray resonant reflectivity technique. Near the absorption edge, fine structure features of energy-dependent atomic scattering factor are sensitive to the composition, and can be exploited for determination of composition at the buried interfaces. This technique is demonstrated for a Mo–Si multilayer system using soft x-ray resonant reflectivity measurement
In this review, the technique of resonant soft X-ray reflectivity in the study of magnetic low-dimen...
Interfaces between individual layers in thin films and multilayers affect mechanical, optical, elect...
In this review, the technique of resonant soft X-ray reflectivity in the study of magnetic low-dimen...
The authors report determination of interlayer composition with subnanometer sensitivity at the buri...
The soft X-ray reflectivity characterization of Mo/Si multilayer deposited by electron beam evaporat...
We explored the possibility to quantify the atomic in-depth distributions by using the energy-depend...
We introduce a novel approach that addresses the probing of interfacial structural phenomena in laye...
The analysis of x-ray reflectivity data from artificial heterostructures usually relies on the homog...
We explored the possibility to quantify the atomic in depth distributions by using the energy depend...
Current technology has made possible the fabrication of multilayered optical elements for soft x-ray...
Accurate measurements of optical properties of multilayer (ML) mirrors and chemical compositions of ...
We discuss a new method to characterize multilayer structures with grazing-incidence reflectivity me...
The present paper reviews recent extensions of the X-ray reflectivity technique, which is a powerful...
Specular and non-specular X-ray reflectivity measurements can be exploited to obtain interesting pro...
Layered structures play a fundamental role in modern technology. The characterization of these layer...
In this review, the technique of resonant soft X-ray reflectivity in the study of magnetic low-dimen...
Interfaces between individual layers in thin films and multilayers affect mechanical, optical, elect...
In this review, the technique of resonant soft X-ray reflectivity in the study of magnetic low-dimen...
The authors report determination of interlayer composition with subnanometer sensitivity at the buri...
The soft X-ray reflectivity characterization of Mo/Si multilayer deposited by electron beam evaporat...
We explored the possibility to quantify the atomic in-depth distributions by using the energy-depend...
We introduce a novel approach that addresses the probing of interfacial structural phenomena in laye...
The analysis of x-ray reflectivity data from artificial heterostructures usually relies on the homog...
We explored the possibility to quantify the atomic in depth distributions by using the energy depend...
Current technology has made possible the fabrication of multilayered optical elements for soft x-ray...
Accurate measurements of optical properties of multilayer (ML) mirrors and chemical compositions of ...
We discuss a new method to characterize multilayer structures with grazing-incidence reflectivity me...
The present paper reviews recent extensions of the X-ray reflectivity technique, which is a powerful...
Specular and non-specular X-ray reflectivity measurements can be exploited to obtain interesting pro...
Layered structures play a fundamental role in modern technology. The characterization of these layer...
In this review, the technique of resonant soft X-ray reflectivity in the study of magnetic low-dimen...
Interfaces between individual layers in thin films and multilayers affect mechanical, optical, elect...
In this review, the technique of resonant soft X-ray reflectivity in the study of magnetic low-dimen...