Growth of $InSb_{(1-x)}Bi_x$ crystals by rotatory Bridgman method and their characterization

The rotatory Bridgman method was used to grow ternary $InSb_{(1-x)}Bi_x$ crystals. In this method the ampoule was subjected to ACRT like reversible rotation at a peak rate of 60 rpm. High-quality crystals of 8mm diameter and 25mm length were grown with 6.54 atomic percentage of Bi. The grown crystals were characterized employing various techniques such as energy-dispersive X-ray analysis, X-ray diffraction, differential scanning calorimetery, infrared spectroscopy and Hall measurement