This paper describes the effect of MOSFET internal capacitances on the channel current during the turn-on switching transition: an intrinsic theoretical switching speed limit is found and detailed mathematically. The set of analytical equations is solved and the effect of the displacement currents is highlighted with ideal simulated waveforms. A laboratory experiment is thus performed, in order to prove the theoretical predictions: a 25 mΩ SiC CREE power MOSFET is turned on in a no-load condition (zero drain current), starting from different drain-source voltage values. Finally, a LTSpice equivalent circuit model is also built, to better simulate the experimental behavior of the device, adding circuit strain components and other non-idealit...
This thesis is about studying the gate driving of a Mosfet. One step was to build a new circuit boar...
Capacitance-voltage (C-V) gate characteristics of power metal-oxide-semiconductor field-effect trans...
This paper investigates the influence of current-source and voltage-source gate driver on the switch...
This paper describes the effect of MOSFET internal capacitances on the channel current during the tu...
High-speed switching capabilities of SiC MOSFET power modules allow building high power converters w...
This paper investigates the switching performances of two state-of-the-art half-bridge SiC MOSFET mo...
Abstract Due to the high‐speed switching, the switching process of a silicon carbide (SiC) metal oxi...
This paper proposes the influence analysis of silicon carbide (SiC) MOSFET’s parasitic output capaci...
This article presents a comprehensive analysis of nonlinear voltage-dependent capacitances of vertic...
This paper investigates the switching rate and temperature dependence of parasitic (false) turn-on o...
Compared to the silicon power devices, silicon carbide device has shorter switch time. Hence, as a r...
Abstract: The aim of this paper is to calculate the MOSFET parasitic capacitances, and then based on...
Circuit-level analytical models for hard-switching, soft-switching, and dv/dt-induced false turn on ...
This paper makes detail study of the latest SiC MOSFETs switching characteristics in relation to gat...
The paper presents a compact simulation program with integrated circuit emphasis (SPICE) model for a...
This thesis is about studying the gate driving of a Mosfet. One step was to build a new circuit boar...
Capacitance-voltage (C-V) gate characteristics of power metal-oxide-semiconductor field-effect trans...
This paper investigates the influence of current-source and voltage-source gate driver on the switch...
This paper describes the effect of MOSFET internal capacitances on the channel current during the tu...
High-speed switching capabilities of SiC MOSFET power modules allow building high power converters w...
This paper investigates the switching performances of two state-of-the-art half-bridge SiC MOSFET mo...
Abstract Due to the high‐speed switching, the switching process of a silicon carbide (SiC) metal oxi...
This paper proposes the influence analysis of silicon carbide (SiC) MOSFET’s parasitic output capaci...
This article presents a comprehensive analysis of nonlinear voltage-dependent capacitances of vertic...
This paper investigates the switching rate and temperature dependence of parasitic (false) turn-on o...
Compared to the silicon power devices, silicon carbide device has shorter switch time. Hence, as a r...
Abstract: The aim of this paper is to calculate the MOSFET parasitic capacitances, and then based on...
Circuit-level analytical models for hard-switching, soft-switching, and dv/dt-induced false turn on ...
This paper makes detail study of the latest SiC MOSFETs switching characteristics in relation to gat...
The paper presents a compact simulation program with integrated circuit emphasis (SPICE) model for a...
This thesis is about studying the gate driving of a Mosfet. One step was to build a new circuit boar...
Capacitance-voltage (C-V) gate characteristics of power metal-oxide-semiconductor field-effect trans...
This paper investigates the influence of current-source and voltage-source gate driver on the switch...