Add to ORKGThe significance of transistor degradation due to aging mechanisms such as BTI or HCI has increased significantly with the continuous scaling down of CMOS technologies and their presence in safety-critical systems. In order to deliver the reliable systems that the industry currently demands, it is necessary to apply aging simulations in IC design projects. However, the capabilities that are available strongly depend on the EDA environment and tools. In this paper we present the work done in a case study to characterize and model NBTI and HCI degradation for X-FAB’s XU035 technology, and we discuss a methodology developed to implement and integrate user-defined aging models for circuit level simulation with consistent results across differen...
Product development based on highly integrated semiconductor circuits faces various challenges. To e...
Aging mechanisms such as Bias Temperature Instability (BTI) and Channel Hot Carrier (CHC) are key li...
CMOS transistors come with a scaling potential, which brings along challenges such as process variat...
The significance of transistor degradation due to aging mechanisms such as BTI or HCI has increased ...
Aging simulations on circuit level allow IC designers to verify their circuits with respect to relia...
This thesis proposes an approach to consistently integrate transistor aging degradation models acros...
More and more applications of integrated circuits are safety-critical or require particularly long l...
As technology scaling enters the nanometer regime, device aging effects cause quality and reliabilit...
The degradation of integrated field effect transistors (FETs) is an increasingly critical effect for...
As we enter into sub-nanometer technologies in order to increase performance of CMOS devices, reliab...
A novel and comprehensive framework for aging analysis is presented in this work, comprehending degr...
The development of CMOS technology is a double-edged sword: for one thing, it provides faster,lowerp...
Abstract-Degradation of device parameters over the lifetime of a system is emerging as a significant...
In deeply scaled CMOS technologies, device aging causes transistor performance parameters to degrade...
This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important...
Product development based on highly integrated semiconductor circuits faces various challenges. To e...
Aging mechanisms such as Bias Temperature Instability (BTI) and Channel Hot Carrier (CHC) are key li...
CMOS transistors come with a scaling potential, which brings along challenges such as process variat...
The significance of transistor degradation due to aging mechanisms such as BTI or HCI has increased ...
Aging simulations on circuit level allow IC designers to verify their circuits with respect to relia...
This thesis proposes an approach to consistently integrate transistor aging degradation models acros...
More and more applications of integrated circuits are safety-critical or require particularly long l...
As technology scaling enters the nanometer regime, device aging effects cause quality and reliabilit...
The degradation of integrated field effect transistors (FETs) is an increasingly critical effect for...
As we enter into sub-nanometer technologies in order to increase performance of CMOS devices, reliab...
A novel and comprehensive framework for aging analysis is presented in this work, comprehending degr...
The development of CMOS technology is a double-edged sword: for one thing, it provides faster,lowerp...
Abstract-Degradation of device parameters over the lifetime of a system is emerging as a significant...
In deeply scaled CMOS technologies, device aging causes transistor performance parameters to degrade...
This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important...
Product development based on highly integrated semiconductor circuits faces various challenges. To e...
Aging mechanisms such as Bias Temperature Instability (BTI) and Channel Hot Carrier (CHC) are key li...
CMOS transistors come with a scaling potential, which brings along challenges such as process variat...