An EMI-Resistant Common-Mode Cancelation Differential Input Stage in UMC 180 nm CMOS

Richelli, A.
Kennedy, S.
Redouté, Jean-Michel

Open PDF

Open link

Publication date

January 2017

DOI

10.1109/TEMC.2017.2696166

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Abstract

This letter presents an on-chip common-mode cancelation circuit (CMCC), which increases the immunity to electromagnetic interference (EMI) of the input stage in a classic CMOS operational amplifier. Two test chips, containing a classic Miller amplifier and a Miller amplifier with CMCC, respectively, have been fabricated in the UMC 180 nm CMOS process. Measurements illustrate how the latter amplifier exhibits an increased immunity to EMI compared with the former. © 2017 IEEE

Extracted data

We use cookies to provide a better user experience.

Data Protection

An EMI-Resistant Common-Mode Cancelation Differential Input Stage in UMC 180 nm CMOS

Abstract

Extracted data

An EMI-Resistant Common-Mode Cancelation Differential Input Stage in UMC 180 nm CMOS

Abstract

Extracted data

Related items

Related items