This thesis looks at extending previous work in the field of accelerated life testing experiments. Hitherto, much investigation in this field has centred on a few standard statistical lifetime distributions, the Weibull being particularly popular. We consider a more flexible distribution, the Burr XII, and compare theoretical and simulated results; we also examine a number of examples. This comparison is interesting particularly since there is a limiting relationship between the two distributions, a property that is exploited in this thesis. Having laid down the necessary groundwork, we then proceed to fit the Weibull and Burr XH models to completely failed, published data sets and compare results. In order to assess our ability to make sma...
AbstractThis article considers the estimation of parameters of Weibull distribution based on hybrid ...
This article has been made available through the Brunel Open Access Publishing Fund.Constant-stress ...
In this paper, we propose a new lifetime distribution, namely the extended Burr XII distribution (us...
An accelerated life test (ALT) is often used to obtain timely information for highly reliable items....
An accelerated life test (ALT) is often used to obtain timely information for highly reliable items....
A simple step-stress accelerated life test (ALT) under progressive censoring of Type-II is considere...
In accelerated life testing researcher generally use a life stress relationship between life charact...
In this article, estimation problems for the Burr X distribution under a progressive-stress accelera...
This article presents the development of a general Bayes inference model for accelerated life testin...
ABSTRACT: This article presents the development of a general Bayes inference model for accelerated l...
Reliability life testing is used for life data analysis in which samples are tested under normal con...
Accelerated life testing provides an interesting challenge for quantification of the uncertainties i...
In a competitive world where products are designed to last for long periods of time, obtaining time-...
In this paper, we describe how to design and analyze the accelerated life testing (ALTg) plans for t...
In this paper, we describe how to design and analyze the accelerated life testing (ALTg) plans for t...
AbstractThis article considers the estimation of parameters of Weibull distribution based on hybrid ...
This article has been made available through the Brunel Open Access Publishing Fund.Constant-stress ...
In this paper, we propose a new lifetime distribution, namely the extended Burr XII distribution (us...
An accelerated life test (ALT) is often used to obtain timely information for highly reliable items....
An accelerated life test (ALT) is often used to obtain timely information for highly reliable items....
A simple step-stress accelerated life test (ALT) under progressive censoring of Type-II is considere...
In accelerated life testing researcher generally use a life stress relationship between life charact...
In this article, estimation problems for the Burr X distribution under a progressive-stress accelera...
This article presents the development of a general Bayes inference model for accelerated life testin...
ABSTRACT: This article presents the development of a general Bayes inference model for accelerated l...
Reliability life testing is used for life data analysis in which samples are tested under normal con...
Accelerated life testing provides an interesting challenge for quantification of the uncertainties i...
In a competitive world where products are designed to last for long periods of time, obtaining time-...
In this paper, we describe how to design and analyze the accelerated life testing (ALTg) plans for t...
In this paper, we describe how to design and analyze the accelerated life testing (ALTg) plans for t...
AbstractThis article considers the estimation of parameters of Weibull distribution based on hybrid ...
This article has been made available through the Brunel Open Access Publishing Fund.Constant-stress ...
In this paper, we propose a new lifetime distribution, namely the extended Burr XII distribution (us...