A versatile system is described for the large-signal characterization of microwave power MESFET's. High accuracy is obtained through vector error-correction techniques. The system is calibrated using a procedure based on conventional automatic network analyzer calibration measurements and a series of simple insertion loss measurements. The measurement system provides accurate reflection coefficient and RF power data over a wide range of device loading conditions
A microwave measurement system has been developed that combines a personal computer (PC) and an conv...
This paper investigates the residual calibration uncertainty effects in on-wafer load-pull measureme...
Load-pull measurement systems are the most common and powerful instruments used for the design of po...
Radiofrequency (RF) power amplifiers (PAs) are important elements of modern communication systems. T...
The authors describe a microwave test set that can be automatically reconfigured to perform linear a...
A system is described to measure the periodic time domain voltages and currents of a nonlinear micro...
An on-wafer measurement system has been developed for the complete characterization of the large sig...
After calibration, since the systematic imperfections of the envelop load-pull (ELP) components were...
An improvement to the load-pull technique for a large-signal design of a transistor amplifier is pro...
The design of high frequency large-signal active devices depends heavily upon the accuracy of the mo...
The Error Vector Magnitude (EVM) is a fundamental metric used in communications to quantify the wide...
In this paper we report a method of applying digitally modulated signals to an RF power transistor i...
This letter proposes a new solution to improve the accuracy of real-time load-pull measurement syst...
The quality of measuring systems of the microwave range, including vector network analyzers, largely...
The trend in microwave industry to deliver more for less leads to new semiconductor technologies, in...
A microwave measurement system has been developed that combines a personal computer (PC) and an conv...
This paper investigates the residual calibration uncertainty effects in on-wafer load-pull measureme...
Load-pull measurement systems are the most common and powerful instruments used for the design of po...
Radiofrequency (RF) power amplifiers (PAs) are important elements of modern communication systems. T...
The authors describe a microwave test set that can be automatically reconfigured to perform linear a...
A system is described to measure the periodic time domain voltages and currents of a nonlinear micro...
An on-wafer measurement system has been developed for the complete characterization of the large sig...
After calibration, since the systematic imperfections of the envelop load-pull (ELP) components were...
An improvement to the load-pull technique for a large-signal design of a transistor amplifier is pro...
The design of high frequency large-signal active devices depends heavily upon the accuracy of the mo...
The Error Vector Magnitude (EVM) is a fundamental metric used in communications to quantify the wide...
In this paper we report a method of applying digitally modulated signals to an RF power transistor i...
This letter proposes a new solution to improve the accuracy of real-time load-pull measurement syst...
The quality of measuring systems of the microwave range, including vector network analyzers, largely...
The trend in microwave industry to deliver more for less leads to new semiconductor technologies, in...
A microwave measurement system has been developed that combines a personal computer (PC) and an conv...
This paper investigates the residual calibration uncertainty effects in on-wafer load-pull measureme...
Load-pull measurement systems are the most common and powerful instruments used for the design of po...