Evaluation of Single Event Effects Using the Ultrafast Pulsed Laser Facility at the Saskatchewan Structural Sciences Centre

Single event effects have been an issue in microelectronic devices and circuits for some time, especially those used in radiation-intense environments such as space. Traditionally, devices have been tested using particle accelerator facilities for evaluation of the various single event effects phenomena. However, testing at these facilities can be prohibitive to many research groups due to costs and time availability. As a result, pulsed laser testing has evolved to become a standard, additional testing methodology for evaluating single event effects. Not only do pulsed laser facilities generally offer more flexibility in terms of cost, but it is also possible to gain additional information about the spatial and temporal nature of single event effect generation in sensitive areas of a device. To meet the needs of the radiation effects community, pulsed laser facilities have continued to be set up around the world. One of these includes the facility at the Saskatchewan Structural Sciences Centre. An earlier iteration of the facility previously existed which utilized a different equipment set and did not have the two photon absorption capabilities that the current version does. In this thesis, a sample of the work performed at the facility using both the single and two photon absorption capabilities are provided to demonstrate its capabilities; the devices tested for single event effect response included two Hall effect sensors and a Xilinx Virtex-5 FPGA. Additionally, a description of the main features of the facility in its current form is given. Through this work, the feasibility of the facility to provide results to users, both academic and industrial, is demonstrated