One of the key limiting factors to progress within nano science is the ability to measure properties on the relevant length scale. The probe size provided by optical measurements is often larger than the individual nanoscale structures, and the resulting measurement is an average over some large volume, thus other methods must be applied. Electron Energy Loss Spectroscopy (EELS) in a Transmission Electron Microscope (TEM) provides a probe size suitable for measuring on nanoscopic structures, but the physics of the probe change when using electrons instead of photons. The fast electrons passing through the sample carry a significant momentum in addition to energy, and both can be transferred to an electron in the sample. The possible transfe...
An extension to model based electron energy loss spectroscopy (EELS) quantifi-cation is reported to ...
This thesis explores the analytical capabilities of low-loss electron energy loss spectroscopy (EELS...
This is an AAM - Author Accepted Manuscript of the article published by Elsevier B.V. in Ultramicros...
In the Transmission Electron Microscope (TEM), an incident electron suffers both elastic and inelast...
[eng] In the Transmission Electron Microscope (TEM), an incident electron suffers both elastic and ...
Electron energy loss (EEL) spectroscopy carried out within a (scanning) transmission electron micros...
© (2008) Dr. Christopher WitteThis thesis explores the theory of electron energy-loss spectroscopy (...
Electron energy-loss spectroscopy (EELS) involves measurement of the energy distribution of electron...
Experimental techniques for electron energy loss spectroscopy (EELS) combine high energy resolution ...
Many modern (Scanning) Transmission Electron Microscopes ((S)TEMs) are equipped with an energy loss ...
Many modern (Scanning) Transmission Electron Microscopes ((S)TEMs) are equipped with an energy loss ...
Electron Energy Loss Spectroscopy (EELS) is the statistical observation of energy loss of the emitte...
Electron Energy Loss Spectroscopy (EELS) is the statistical observation of energy loss of the emitte...
Podeu consultar el llibre complet a: http://hdl.handle.net/2445/32166In the present work we review t...
We discuss various factors that determine the performance of electron energy-loss spectroscopy (EELS...
An extension to model based electron energy loss spectroscopy (EELS) quantifi-cation is reported to ...
This thesis explores the analytical capabilities of low-loss electron energy loss spectroscopy (EELS...
This is an AAM - Author Accepted Manuscript of the article published by Elsevier B.V. in Ultramicros...
In the Transmission Electron Microscope (TEM), an incident electron suffers both elastic and inelast...
[eng] In the Transmission Electron Microscope (TEM), an incident electron suffers both elastic and ...
Electron energy loss (EEL) spectroscopy carried out within a (scanning) transmission electron micros...
© (2008) Dr. Christopher WitteThis thesis explores the theory of electron energy-loss spectroscopy (...
Electron energy-loss spectroscopy (EELS) involves measurement of the energy distribution of electron...
Experimental techniques for electron energy loss spectroscopy (EELS) combine high energy resolution ...
Many modern (Scanning) Transmission Electron Microscopes ((S)TEMs) are equipped with an energy loss ...
Many modern (Scanning) Transmission Electron Microscopes ((S)TEMs) are equipped with an energy loss ...
Electron Energy Loss Spectroscopy (EELS) is the statistical observation of energy loss of the emitte...
Electron Energy Loss Spectroscopy (EELS) is the statistical observation of energy loss of the emitte...
Podeu consultar el llibre complet a: http://hdl.handle.net/2445/32166In the present work we review t...
We discuss various factors that determine the performance of electron energy-loss spectroscopy (EELS...
An extension to model based electron energy loss spectroscopy (EELS) quantifi-cation is reported to ...
This thesis explores the analytical capabilities of low-loss electron energy loss spectroscopy (EELS...
This is an AAM - Author Accepted Manuscript of the article published by Elsevier B.V. in Ultramicros...