We studied the microstructural evolution of multiple layers of elastically stiff films embedded in an elastically soft matrix using a phase field model. The coherent and planar film/matrix interfaces are rendered unstable by the elastic stresses due to a lattice parameter mismatch between the film and matrix phases, resulting in the break-up of the films into particles. With an increasing volume fraction of the stiff phase, the elastic interactions between neighbouring layers lead to: (i) interlayer correlations from an early stage; (ii) a longer wavelength for the maximally growing wave; and therefore (iii) a delayed break-LIP. Further, they promote a crossover in the mode of instability from a predominantly anti-symmetric (in phase) one t...
Phase-field microelastic modeling of microstructure evolutions in free-standing thin films is develo...
The surface stability of two interacting (for example, by van der Waals or electrostatic forces) inc...
AbstractThe morphological evolution of strained films is of technological importance to microelectro...
We studied the microstructural evolution of multiple layers of elastically stiff films embedded in a...
Cahn-Hilliard type of phase-field (PF) model coupled with elasticity equations is used to study the ...
We investigate the morphological transitions of surface patterns induced in a soft elastic film in t...
We investigate the morphological transitions of surface patterns induced in a soft elastic film in t...
We apply a linear stability analysis to examine the effect of misfit stress on the interface diffusi...
grantor: University of TorontoWe theoretically and numerically study the growth of thin al...
grantor: University of TorontoWe theoretically and numerically study the growth of thin al...
Governing equations for solid state phase transformation are derived by coupling Cahn-Hilliard type ...
Electric-field-induced instabilities in thin bilayers composed of either purely viscous or purely el...
Subject to a compressive membrane stress, an elastic film bonded on a substrate can become unstable,...
We present results from a comprehensive numerical study of morphological phase separation (MPS) in u...
We present results from a comprehensive numerical study of morphological phase separation (MPS) in u...
Phase-field microelastic modeling of microstructure evolutions in free-standing thin films is develo...
The surface stability of two interacting (for example, by van der Waals or electrostatic forces) inc...
AbstractThe morphological evolution of strained films is of technological importance to microelectro...
We studied the microstructural evolution of multiple layers of elastically stiff films embedded in a...
Cahn-Hilliard type of phase-field (PF) model coupled with elasticity equations is used to study the ...
We investigate the morphological transitions of surface patterns induced in a soft elastic film in t...
We investigate the morphological transitions of surface patterns induced in a soft elastic film in t...
We apply a linear stability analysis to examine the effect of misfit stress on the interface diffusi...
grantor: University of TorontoWe theoretically and numerically study the growth of thin al...
grantor: University of TorontoWe theoretically and numerically study the growth of thin al...
Governing equations for solid state phase transformation are derived by coupling Cahn-Hilliard type ...
Electric-field-induced instabilities in thin bilayers composed of either purely viscous or purely el...
Subject to a compressive membrane stress, an elastic film bonded on a substrate can become unstable,...
We present results from a comprehensive numerical study of morphological phase separation (MPS) in u...
We present results from a comprehensive numerical study of morphological phase separation (MPS) in u...
Phase-field microelastic modeling of microstructure evolutions in free-standing thin films is develo...
The surface stability of two interacting (for example, by van der Waals or electrostatic forces) inc...
AbstractThe morphological evolution of strained films is of technological importance to microelectro...