Improved electron-beam ion-trap lifetime measurement of the Ne8+ 1s2s3S1 level

An earlier electron-beam ion-trap (EBIT) lifetime measurement of the Ne8+ 1s2s3S1 level has been improved upon, reducing the uncertainties to less than the scatter in the existing theoretical calculations. The new result, 91.7±0.4 μs, agrees with the previous value, but is more precise by a factor of 4. The new value distinguishes among theoretical values, as agreement is obtained only with those calculations that employ "exact" nonrelativistic or relativistic wave functions. Routes to measurements with even higher accuracy are discussed