In vacuo XPS investigation of Cu In,Ga Se2 surface after RbF post deposition treatment

Latest record efficiencies of Cu In,Ga Se2 CIGSe solar cells were achieved by means of a rubidium fluoride RbF post deposition treatment PDT . To understand the effect of the RbF PDT on the surface chemistry of CIGSe and its interaction with sodium that is generally present in the CIGSe absorber, we performed an X ray photoelectron spectroscopy XPS study on CIGSe thin films as deposited by a three stage co evaporation process and after the consecutive RbF PDT. The sample transfer from the deposition to the XPS analysis chamber was performed via an ultra high vacuum transfer system. This allows to minimize air exposure, avoiding oxide formation on the CIGSe surface, especially for alkali treated absorbers. Beside an expected reduction of Cu and Ga content at the surface of RbF treated CIGSe films, we find that Rb penetrates the CIGSe and, contrary to fluorine, it is not completely removed by subsequent ammonia etching. The remaining Rb contribution at 110.0 amp; 8239;eV binding energy, which appears after the RbF PDT is similar to the one detected on a co evaporated RbInSe2 reference sample and together with a new Se 3d contribution may hence belong to an Rb In Se secondary phase on the CIGSe surface. In addition, Na is driven towards the surface of the CIGSe absorber as a direct result of the RbF PDT. This proves the ion exchange mechanism in the absence of moisture and air oxygen between heavy Rb atoms incorporated via PDT and lighter Na atoms supplied by the glass substrate. A remaining XPS signal of Na 1 amp; 8239;s is observed after etching the vacuum transferred RbF CIGSe sample, indicating that Rb and or F are not as much a driving force for Na as oxygen usually i