We propose a low cost concurrent error detection strategy to improve the Reliability, Availability, Serviceability (RAS) of high performance microprocessors, by specifically targeting one of its most critical blocks (from the point of view of the microprocessor RAS), that is the control logic. By discovering codes that are inherently present within the control logic because of its performed functionality and verification needs (referred to as Control Logic Function-Inherent Codes), it allows to achieve concurrent error detection at very limited costs in terms of area, power consumption, impact on performance and design. Considering for instance the case of the instruction decoder of a public domain microprocessor, we will prove that our app...
We propose a new on-line testing approach for the control logic of high performance microprocessors....
We propose a new on-line testing approach for the control logic of high performance microprocessors....
We propose a new on-line testing approach for the control logic of high performance microprocessors....
We propose a low cost concurrent error detection strategy to improve the Reliability, Availability, ...
We propose a low cost concurrent error detection strategy to improve the Reliability, Availability, ...
We propose a low cost concurrent error detection strategy to improve the Reliability, Availability, ...
We propose a low cost concurrent error detection strategy to improve the Reliability, Availability, ...
We propose a low cost concurrent error detection strategy to improve the Reliability, Availability, ...
We propose a low cost concurrent error detection strategy to improve the Reliability, Availability, ...
We propose a low cost concurrent error detection strategy to improve the Reliability, Availability, ...
This paper presents a concurrent error detection tech-nique targeted towards control logic in a proc...
This thesis addresses three important steps in the selection of error detection mechanisms for micro...
This thesis addresses three important steps in the selection of error detection mechanisms for micro...
There is broad consensus among academic and industrial researchers in computer architecture that har...
We propose an on-line testing approach for the control logic of high performance microprocessors. Ra...
We propose a new on-line testing approach for the control logic of high performance microprocessors....
We propose a new on-line testing approach for the control logic of high performance microprocessors....
We propose a new on-line testing approach for the control logic of high performance microprocessors....
We propose a low cost concurrent error detection strategy to improve the Reliability, Availability, ...
We propose a low cost concurrent error detection strategy to improve the Reliability, Availability, ...
We propose a low cost concurrent error detection strategy to improve the Reliability, Availability, ...
We propose a low cost concurrent error detection strategy to improve the Reliability, Availability, ...
We propose a low cost concurrent error detection strategy to improve the Reliability, Availability, ...
We propose a low cost concurrent error detection strategy to improve the Reliability, Availability, ...
We propose a low cost concurrent error detection strategy to improve the Reliability, Availability, ...
This paper presents a concurrent error detection tech-nique targeted towards control logic in a proc...
This thesis addresses three important steps in the selection of error detection mechanisms for micro...
This thesis addresses three important steps in the selection of error detection mechanisms for micro...
There is broad consensus among academic and industrial researchers in computer architecture that har...
We propose an on-line testing approach for the control logic of high performance microprocessors. Ra...
We propose a new on-line testing approach for the control logic of high performance microprocessors....
We propose a new on-line testing approach for the control logic of high performance microprocessors....
We propose a new on-line testing approach for the control logic of high performance microprocessors....