In this paper we analyze the probability that transient faults, multiple or single, affecting a checker of a self-checking circuit (with particular reference to the case of circuits using the two-rail code, the parity code, the Berger code and the Bose–Lin code) give rise to no-harm alarms, here defined as indications of errors neither denoting the presence of an incorrect word at the output of the functional block, nor denoting the presence of checker internal faults possibly compromising its ability to discriminate input codewords from input non-codewords. Differently from all other error indications, no-harm alarms could be conveniently ignored (or tolerated) by the system, with no need to adopt any recovery strategy upon their reception...
In this paper, we analyze the reliability of self-checking circuits. A case study is presented in wh...
In this paper we propose a probabilistic measure for self-checking (SC) circuits that is analogous t...
This paper shows how the use of exhaustive fault injection campaigns in conjunction with the analysi...
In this paper we analyze the probability that transient faults, multiple or single, affecting a chec...
In this paper we analyze the probability that transient faults, multiple or single, affecting a chec...
In this paper we evaluate the probability that a transient fault (TF), multiple or single, affecting...
In self-checking systems, checkers usually do not receive all code words during normal operation. Mi...
In self-checking systems, checkers usually do not receive all code words during normal operation. Mi...
Abstract-Self-checking circuits can detect the presence of both transient and permanent faults. A se...
In this paper we propose a probabilistic measurement for totally self-checking (TSC) circuits. This ...
The design of self-checking circuits through output encoding finds a bottleneck in the realization o...
none3In this paper, we propose a compact, high-speed, and highly testable parallel two-rail code che...
In this paper, we propose a compact, high-speed, and highly testable parallel two-rail code checker,...
ISBN: 0080348017Theoretical developments and practical applications of self-checking circuits are pr...
This paper analyses some of the most common error-detecting codes used in self-checking circuits wit...
In this paper, we analyze the reliability of self-checking circuits. A case study is presented in wh...
In this paper we propose a probabilistic measure for self-checking (SC) circuits that is analogous t...
This paper shows how the use of exhaustive fault injection campaigns in conjunction with the analysi...
In this paper we analyze the probability that transient faults, multiple or single, affecting a chec...
In this paper we analyze the probability that transient faults, multiple or single, affecting a chec...
In this paper we evaluate the probability that a transient fault (TF), multiple or single, affecting...
In self-checking systems, checkers usually do not receive all code words during normal operation. Mi...
In self-checking systems, checkers usually do not receive all code words during normal operation. Mi...
Abstract-Self-checking circuits can detect the presence of both transient and permanent faults. A se...
In this paper we propose a probabilistic measurement for totally self-checking (TSC) circuits. This ...
The design of self-checking circuits through output encoding finds a bottleneck in the realization o...
none3In this paper, we propose a compact, high-speed, and highly testable parallel two-rail code che...
In this paper, we propose a compact, high-speed, and highly testable parallel two-rail code checker,...
ISBN: 0080348017Theoretical developments and practical applications of self-checking circuits are pr...
This paper analyses some of the most common error-detecting codes used in self-checking circuits wit...
In this paper, we analyze the reliability of self-checking circuits. A case study is presented in wh...
In this paper we propose a probabilistic measure for self-checking (SC) circuits that is analogous t...
This paper shows how the use of exhaustive fault injection campaigns in conjunction with the analysi...