Solid immersion facilitates fluorescence microscopy with nanometer resolution and sub-ångström emitter localization
- Wildanger, Dominik
- Patton, Brian R.
- Schill, Heiko
- Marseglia, Luca
- Hadden, J. P.
- Knauer, Sebastian
- Schönle, Andreas
- Rarity, John G.
- O'Brien, Jeremy L.
- Hell, Stefan W.
- Smith, Jason M.
DOIAbstract
Exploring the maximum spatial resolution achievable in far‐field optical imaging, we show that applying solid immersion lenses (SIL) in stimulated emission depletion (STED) microscopy addresses single spins with a resolution down to 2.4 ± 0.3 nm and with a localization precision of 0.09 nm
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