<div><p>The present work briefly reviews the convolution of crystallite shape functions and discusses its experimental limitations. The diffraction from a theoretical spherical shape powder is used to exemplify the limits of the convolution procedure. Mean lattice distortions were not considered since the discussed limitations are inherent to the convolution method using Fourier transforms. The diffraction pattern and the convolution were calculated using appropriate macros for the Topas program. It is shown that very small crystallites require a large 2θ convolution span and the smallest subdivision for the distribution will depend on this convolution span. To show the importance of the convolution limits and its application, the nanocryst...
A complete set of structure factors has been extracted from hundreds of thousands of femtosecond sin...
The new theoretical outline for determination of the metal crystallite nanosize and lattice strain f...
The convolutive X-ray peak profile-fitting methodology described in the previous paper [Enzo, Fagher...
Crystallite size determination based on diffraction peak broadening is a widely used technique with ...
An elegant mathematical technique has been developed and tested for computing the shapes of nanocrys...
An accurate description of the diffraction line profile from nanocrystalline powders can be obtained...
Two different methods of diffraction profile analysis are presented. In the first, the breadths and ...
The microstructural parameters of a crystalline sample can be determined by a proper analysis of XRD...
The microstructural parameters of a crystalline sample can be determined by a proper analysis of XRD...
When presenting a diffraction pattern of the material under study, it is a good practice to list the...
This paper addresses the use of a rapid and easily applicable single line-profile analysis technique...
The applicability of standard methods for the evaluation of powder diffraction data of nano-size cry...
Due to their limited length of structural coherence nanocryst. materials show very diffuse powder x-...
Colloidal superlattices are fascinating materials made of ordered nanocrystals, yet they are rarely ...
Accurate statistical characterization of nanomaterials is crucial for their use in emerging technolo...
A complete set of structure factors has been extracted from hundreds of thousands of femtosecond sin...
The new theoretical outline for determination of the metal crystallite nanosize and lattice strain f...
The convolutive X-ray peak profile-fitting methodology described in the previous paper [Enzo, Fagher...
Crystallite size determination based on diffraction peak broadening is a widely used technique with ...
An elegant mathematical technique has been developed and tested for computing the shapes of nanocrys...
An accurate description of the diffraction line profile from nanocrystalline powders can be obtained...
Two different methods of diffraction profile analysis are presented. In the first, the breadths and ...
The microstructural parameters of a crystalline sample can be determined by a proper analysis of XRD...
The microstructural parameters of a crystalline sample can be determined by a proper analysis of XRD...
When presenting a diffraction pattern of the material under study, it is a good practice to list the...
This paper addresses the use of a rapid and easily applicable single line-profile analysis technique...
The applicability of standard methods for the evaluation of powder diffraction data of nano-size cry...
Due to their limited length of structural coherence nanocryst. materials show very diffuse powder x-...
Colloidal superlattices are fascinating materials made of ordered nanocrystals, yet they are rarely ...
Accurate statistical characterization of nanomaterials is crucial for their use in emerging technolo...
A complete set of structure factors has been extracted from hundreds of thousands of femtosecond sin...
The new theoretical outline for determination of the metal crystallite nanosize and lattice strain f...
The convolutive X-ray peak profile-fitting methodology described in the previous paper [Enzo, Fagher...