Surface Stresses and a Force Balance at a Contact Line

Results of the coarse-grained molecular dynamics simulations are used to show that the force balance analysis at the triple-phase contact line formed at an elastic substrate has to include a quartet of forces: three surface tensions (surface free energies) and an elastic force per unit length. In the case of the contact line formed by a droplet on an elastic substrate an elastic force is due to substrate deformation generated by formation of the wetting ridge. The magnitude of this force <i>f</i>_el is proportional to the product of the ridge height <i>h</i> and substrate shear modulus <i>G</i>. Similar elastic line force should be included in the force analysis at the triple-phase contact line of a solid particle in contact with an elastic substrate. For this contact problem elastic force obtained from contact angles and surface tensions is a sum of the elastic forces acting from the side of a solid particle and an elastic substrate. By considering only three line forces acting at the triple-phase contact line, one implicitly accounts the bulk stress contribution as a part of the resultant surface stresses. This “contamination” of the surface properties by a bulk contribution could lead to unphysically large values of the surface stresses in soft materials