Influences on relaxation of exchange biasing in NiO/Ni66Co 18Fe16 bilayers
- van der Heijden, P.A.A.
- Maas, T.F.M.M.
- Kools, J.C.S.
- Roozeboom, F.
- van der Zaag, P.J.
- de Jonge, W.J.M.
Publication date
January 1998
DOI Publisher
AIP Publishing ISSN
0021-8979 Citation count (estimate)
21Abstract
The stability of the exchange biasing field, Heb has been studied for NiO/Ni66CO18Fe16 bilayers. A forced antiparallel alignment of the ferromagnetic magnetization to Heb results in a gradual decrease and even a reversal of Heb. The decrease of Heb increases with temperature and is independent of the external field and NiO layer thickness. This decrease can be interpreted by a thermally assisted relaxation process. A new effect of the relaxation process on Heb is demonstrated by using different cooling rates
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