Fine-grain analysis of the parameters involved in aging of digital circuits

Conference of 22nd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2016 ; Conference Date: 4 July 2016 Through 6 July 2016; Conference Code:124500International audienceIntegrated circuits' aging is recognized as a key reliability bottleneck. Its estimation at design time is mandatory to define the lifetime of the circuit and its monitoring during the circuit's operation is necessary to guarantee high performances and avoid timing failures. Various parameters are involved in the process of aging. The knowledge of their impact can help the designer in optimizing the estimation at design time or selecting which parameters are most critical to monitor. This paper presents a fine-grain analysis of the parameters involved in the degradation of digital circuits