Influence of substrate temperature and overlap condition on the evaporation behavior of inkjet-printed semiconductor layers in organic thin film transistors

In this study, we investigate the evaporation behavior of inkjet-printed semiconductor layers of 6,13bis( triisopropylsilylethynyl) pentacene (TIPS pentacene) to obtain well-oriented crystalline structures for the fabrication of high-performance organic thin film transistors (OTFTs). Variations in overlap and substrate temperature are considered to control the evaporation behavior and the resulting crystalline structures of the layers. The internal flow and corresponding contact line movement can be controlled via three representative inkjet-printing regimes. For inkjet-printing regimes that induce outward convective flow(the coffee stain effect), randomly-oriented TIPS pentacene crystalline structures are produced by irregular contact line receding. With an optimized inkjet-printing regime, uniform bottom contact line movement is generated by the unidirectional internal flow, resulting in well-oriented crystalline structures. All-inkjet-printed OTFTs with semiconductor layers inkjet-printed using the optimized regime exhibit a high field effect mobility of similar to 0.13 cm(2)/Vs, due to the one-dimensionally-oriented TIPS pentacene crystal arrays. (C) 2015 Elsevier B.V. All rights reserved.This work was supported by the Basic Science Research Program through the National Research Foundation of Korea (NRF), funded by the Ministry of Education (NRF-2013R1A1A2011800)