Chemical vapor deposition and electric characterization of perovskite oxides LaMO3 (M = Co, Fe, Cr and Mn) thin films

Tchoua Ngamou PH, Bahlawane N. Chemical vapor deposition and electric characterization of perovskite oxides LaMO3 (M = Co, Fe, Cr and Mn) thin films. JOURNAL OF SOLID STATE CHEMISTRY. 2009;182(4):849-854.Oxides with a perovskite structure are important functional materials often used for the development of modern devices. In view of extending their applicability, it is necessary to efficiently control their growth as thin films using technologically relevant synthesis methods. Pulsed spray evaporation CVD Was used to grow several perovskite-type oxides on planar silicon substrates at temperatures ranging from 500 to 700 degrees C. The optimization of the process control parameters allows the attainment of the perovskite structure as a single phase. The electrical characterization using the temperature-dependent conductivity and thermopower indicates the p-type conduction of the grown films and shows a decreasing concentration of the charge Carrier, mobility and band gap energy in the sequence LaCoO3>LaMnO3>LaCrO3>LaFeO3. The investigation of the electric properties of the obtained perovskite thin films shows the versatility of CVD as a method for the development of innovative devices. (C) 2009 Elsevier Inc. All rights reserved