Secondary electron (SE) Surface-sensitive imaging detection in Scanning Electron Microscopy (SEM) probes space-charge field distributions and potentials at surfaces and interfaces [1,2]. Recently, its combination with optical excitation has opened wider scenarios [3,4,5,6]. In this work we present the combination of a customized SEM with laser light excitation of the sample under test in a Light-Assisted SEM configuration (LASEM). LASEM relies on the optically induced local modification of SE yield to provide real-time mapping of photo-voltages and charge dynamics, and qualifies as a complementary approach to near-field probe microscopies [7] and nonlinear photoemission spectroscopies [8]. We applied LASEM to thin films of Metal Ammonium Le...
Abstract Ultrafast Scanning Electron Microscopy (USEM) aims at combining the temporal resolution of...
To leverage the outstanding photonic qualities of lead halide hybrid perovskites under high optical ...
Photo-assisted Ultrafast Scanning Electron Microscopy (USEM) maps the dynamics of surface photovolta...
Secondary electron (SE) Surface-sensitive imaging detection in Scanning Electron Microscopy (SEM) pr...
We introduce laser-assisted Time-Resolved SEM (TR-SEM), joining Scanning Electron Microscopy and las...
Secondary electrons (SE) imaging in Scanning Electron Microscope (SEM) is a very versatile and power...
We introduce laser-assisted Time-Resolved dynamical SEM technique (TR-SEM), to provide 2D mapping of...
Photon—assisted Ultrafast Scanning Electron Microscopy (USEM) is a novel stroboscopic pump-probe tec...
Hybrid lead halide perovskites are most highly-performing absorber materials for advanced thin film ...
Abstract Ultrafast Scanning Electron Microscopy (USEM) aims at combining the temporal resolution of...
To leverage the outstanding photonic qualities of lead halide hybrid perovskites under high optical ...
Photo-assisted Ultrafast Scanning Electron Microscopy (USEM) maps the dynamics of surface photovolta...
Secondary electron (SE) Surface-sensitive imaging detection in Scanning Electron Microscopy (SEM) pr...
We introduce laser-assisted Time-Resolved SEM (TR-SEM), joining Scanning Electron Microscopy and las...
Secondary electrons (SE) imaging in Scanning Electron Microscope (SEM) is a very versatile and power...
We introduce laser-assisted Time-Resolved dynamical SEM technique (TR-SEM), to provide 2D mapping of...
Photon—assisted Ultrafast Scanning Electron Microscopy (USEM) is a novel stroboscopic pump-probe tec...
Hybrid lead halide perovskites are most highly-performing absorber materials for advanced thin film ...
Abstract Ultrafast Scanning Electron Microscopy (USEM) aims at combining the temporal resolution of...
To leverage the outstanding photonic qualities of lead halide hybrid perovskites under high optical ...
Photo-assisted Ultrafast Scanning Electron Microscopy (USEM) maps the dynamics of surface photovolta...