Magerle R, Burchard A, Deicher M, Kerle T, Pfeiffer W, Recknagel E. Radioactive isotopes in photoluminescence experiments: Identification of defect levels. Physical Review Letters. 1995;75(8):1594-1597.The characteristic lifetimes of radioactive isotopes can be used to label and identify defect levels in semiconductors which can be detected by photoluminescence (PL). This is demonstrated in GaAs doped with radioactive In-111. During its decay to Cd-111 all those PL peaks increase for which Cd accepters are involved. By deriving a quantitative relation between PL intensity and Cd concentration we show that this intensity increase is determined only by the nuclear lifetime of In-111. Thus we gain a complete and independent identification of t...
A range of optical, electrical and radiation techniques were used to study the performance of GaAs a...
Time‐resolved photoluminescence decay measurements are used to explore minority carrier recombinatio...
Photoluminescence (PL) studies of defect-related processes in high-purity GaAs and related III-V com...
Radioactive atoms have been used in solid-state physics and in material science for many decades. Be...
Contains fulltext : mmubn000001_103689621.pdf (publisher's version ) (Open Access)...
The application of the photoluminescence technique to m asure indium in InxGa~_~As emi-insulating, l...
The implantation of radioactive isotopes into semiconductor materials is a powerful technique that e...
183 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1985.The analysis of low temperatu...
Title: Photoluminescence of CdTe crystals Author: Jan Procházka Department: Institute of Physics of ...
Photoluminescence excitation correlation spectroscopy is used to space and time resolve photolumines...
A power-dependent relative photoluminescence measurement method is developed for double-heterostruct...
We report very intense photoluminescence in spray-pyrolyzed CdTe at 77 K. We also notice striking si...
Bridgman-grown, nominally undoped CdTe crystals were doped with Ag by implanting radioactive $^{111}...
The chemical identification of donor bound excitons in ZnO has been studied using radioactive ions. ...
The results of a photolummescence (PL) study of indium implanted silicon are presented. When silicon...
A range of optical, electrical and radiation techniques were used to study the performance of GaAs a...
Time‐resolved photoluminescence decay measurements are used to explore minority carrier recombinatio...
Photoluminescence (PL) studies of defect-related processes in high-purity GaAs and related III-V com...
Radioactive atoms have been used in solid-state physics and in material science for many decades. Be...
Contains fulltext : mmubn000001_103689621.pdf (publisher's version ) (Open Access)...
The application of the photoluminescence technique to m asure indium in InxGa~_~As emi-insulating, l...
The implantation of radioactive isotopes into semiconductor materials is a powerful technique that e...
183 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1985.The analysis of low temperatu...
Title: Photoluminescence of CdTe crystals Author: Jan Procházka Department: Institute of Physics of ...
Photoluminescence excitation correlation spectroscopy is used to space and time resolve photolumines...
A power-dependent relative photoluminescence measurement method is developed for double-heterostruct...
We report very intense photoluminescence in spray-pyrolyzed CdTe at 77 K. We also notice striking si...
Bridgman-grown, nominally undoped CdTe crystals were doped with Ag by implanting radioactive $^{111}...
The chemical identification of donor bound excitons in ZnO has been studied using radioactive ions. ...
The results of a photolummescence (PL) study of indium implanted silicon are presented. When silicon...
A range of optical, electrical and radiation techniques were used to study the performance of GaAs a...
Time‐resolved photoluminescence decay measurements are used to explore minority carrier recombinatio...
Photoluminescence (PL) studies of defect-related processes in high-purity GaAs and related III-V com...